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Keywords: semiconductor devices
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eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1980
ISBN-10: 0-8031-0390-5
ISBN: 978-0-8031-0390-0
... the photocurrent as a function of the space charge region width yields the diffusion length for holes in the n region. Using light of 1.15-μm wavelength in the same type of measurement yields the diffusion length of electrons in the p + region. semiconductor devices diffusion (length) optical...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1977
ISBN-10: 0-8031-0196-1
ISBN: 978-0-8031-0196-8
... The hermetic testing of semiconductor devices is a challenging subject area because of the need for leak testing large numbers of sealed packages to very fine leak rates, where the packages are of a wide range of materials and internal volumes. The types of measurement methods to be discussed...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
... spectrometers will be given and compared with the theoretical limitations. Finally, future possibilities in the development of X-ray energy analyzers will be assessed. semiconductor devices spectrometers silicon germanium X-ray spectra X-ray analysis electromagnetic noise cryogenics preamplifiers...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
... variable is emphasized. semiconductors (materials) semiconductor devices X-ray spectrometers X-ray analysis preamplifiers amplifiers resolution performance F. J. Walter I Characterization of Semiconductor X-ray Energy Spectrometers REFERENCE: Walter, F. J., "Characterization...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
... beams, radioactive isotopes, X-ray tubes, X-ray spectra, electronic noise, semiconductor devices, silicon, field effect transistors Energy dispersion X-ray analysis has become a useful technique in the fields of X-ray fluorescence, electron microprobe analysis, scanning electron microscopy (SEM...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
... beam to the detector (a few millimeters) is observed; and ( c ) X-ray signals from particles 1000 Å in diameter are detectable with peak-to-background ratios of about two. transmission electron microscopy X-ray spectroscopy semiconductor devices extraction replicas thin films particle...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
... obtainable at the present state of the art; the possibilities for development in the near future are discussed. semiconductor devices X-ray spectrometers X-ray fluorescence background noise spectrochemical analysis detection energy absorption resolution J. C. Russ 1 Light Element Analysis...