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Keywords: resolution
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eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1989
ISBN-10: 0-8031-1251-3
ISBN: 978-0-8031-1251-3
... The results of an investigation are presented which compare the effectiveness of various data acquisition methods for automated single specimen J IC testing. Also discussed are the resolution requirements for obtaining acceptable elastic compliance unload data with 12-bit, 14-bit, and 16-bit...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1988
ISBN-10: 0-8031-1178-9
ISBN: 978-0-8031-1178-3
... fluorescence detection chirality amino acid aspartame resolution sensitivity temperature micelle Philippe Gozel and Richard N Zare 1 Resolution of DL-Amino Acids by Capillary Zone Electrophoresis Using Chiral Electrolytes REFERENCE: Gozel, P, and Zare, R N , "Resolution of DL-Amino Acids by Capillary...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1980
ISBN-10: 0-8031-0546-0
ISBN: 978-0-8031-0546-1
... are frequently used, their respective quantitative values may not be comparable due to lack of standardization on definitions and boundary conditions regarding the applicability of these concepts. detection image intensification gain resolution noise image intensifiers W. Kuhl' Detection of X-Rays...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1980
ISBN-10: 0-8031-0277-1
ISBN: 978-0-8031-0277-4
... multiple phases pose special problems. surface analysis electron spectroscopy for chemical analysis (ESCA) X-ray photoelectron spectroscopy (XPS) energy calibration voltage scale Fermi level X-ray energy X-ray intensity resolution instrument transmission static charge flood gun gold...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1974
ISBN-10: 0-8031-0510-X
ISBN: 978-0-8031-0510-2
... be obtained which are strikingly similar to optical photomicrographs. This paper discusses the various signals that are measured in the EMP (X-rays, secondary electrons, backscattered electrons, etc.), their resolution, and the types of information that can be obtained. In addition to elemental analysis...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1974
ISBN-10: 0-8031-0510-X
ISBN: 978-0-8031-0510-2
... diffraction electron scattering resolution penetration micro structure gas ionization A. Szirrnae 1 and R.M. Fisher ~ High Voltage Electron Metallography Achievements and Prospects REFERENCE: Szirmae, A. and Fisher, R.M., "High Voltage Electron Metallog~aphy-Achievements and Prospects," Metallography...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
... The future potential for silicon X-ray detectors is appraised in view of recent accomplishments, present trends, and present physical knowledge. The discussion includes achievements in resolution with both small and large area detectors, and at both low and high count rates. Differences...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
... The important performance parameters of a semiconductor X-ray energy spectrometer and the standardized techniques for measuring and documenting most of the related specifications are described. The strong coupling between performance parameters such as energy resolution, detector size...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
... Semiconducting X-ray detectors with low noise and high resolution have recently become available for the less than 20 keV range which is the region of interest encountered in the examination of X-rays produced in the electron microprobe analyzer. Although their energy resolution is generally...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
.... In examining rough surfaces or when working at low magnification, there is no loss of X-ray intensity because there is no geometric dependence of the energy dispersion detector. At high magnification the energy dispersion detector gives better X-ray resolution because of the smaller incident beam that can...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
... The addition of X-ray emission analysis capabilities to a conventional transmission electron microscope offers a new analytical dimension to the microscopist. The availability of Si(Li) solid-state X-ray detectors with energy resolutions superior to any previous type of X-ray detector provides...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
... of solid-state detectors cannot be met. The inherent statistical fluctuations of the ionization processes involved determine the ultimate resolution of gas counters, and this is inferior to that of the Si(Li) detector. Since energy analysis in the low energy region is more difficult than in the region...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
... obtainable at the present state of the art; the possibilities for development in the near future are discussed. semiconductor devices X-ray spectrometers X-ray fluorescence background noise spectrochemical analysis detection energy absorption resolution J. C. Russ 1 Light Element Analysis...