1-1 of 1
Keywords: large-area damage tests
Close
Follow your search
Access your saved searches in your account

Would you like to receive an alert when new items match your search?
Close Modal
Sort by
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1988
ISBN-10: 0-8031-4479-2
ISBN: 978-0-8031-4479-8
... at one-half the desired output for pulse durations longer than 1 nsec. Operation at higher fluences causes accumulation of damage in the output amplifiers and requires replacement of the disks in those amplifiers on an accelerated schedule. Large-area damage tests have been used to characterize samples...