... Cyclic voltammetry, ellipsometry, and slow strain rate tests have been carried out on copper monocrystals in 0.1 M sodium acetate and 1 M sodium nitrite. These studies demonstrate that the presence of an oxide film is necessary but not sufficient to induce transgranular stress corrosion...

... Refractive indices of transparent materials can be measured with high accuracy on small laboratory samples using null ellipsometry. Measurement precision in both n and k obtained ellipsometrically is ±0.0004 for semitransparent samples. Systematic errors in ellipsometric characterization...

... We have employed two optical techniques which give complementary indications of the formation of monolayers of oxide on freshly evaporated aluminum and silicon thin films. Visible ellipsometry is utilized to observe the growth of the initial monolayer of oxide on these films. From these data, we...

... dramatically compared to adjacent strips. In one case average damage threshold changed from 1.3 to 6.9 J/cm 2 within 100 μm. The width of measured threshold bands in this work ranged from 0.5 to 2.5 J/cm 2 . Anisotropic Stress Ellipsometry Microscope-laser integration Picosecond laser induced damage...

... the two techniques agree well at the 632.8 nm wavelength used for ellipsometry. At thicknesses above 100 nm and wavelengths above 1 μm, the TiO 2 refractive index was insensitive to changes in thickness or wavelength. It increased, as expected, at shorter visible wavelengths, and it decreased markedly...

... this uniformity can be determined interferometrically or by measuring the secondary structure surrounding the reflectance maxima, the most sensitive technique for determining film nonuniformities appears to be ellipsometry. It should be performed at the wavelength at which the mirror is to be used. Typically...