... iodine. iodine Zircaloy-2 stress corrosion fractures (materials) biaxial stresses uniaxial creep slotted rings scanning electron microscopy electron probes microanalysis irradiation zirconium alloys Bob van der Schaaf t Fracture of Zircaloy-2 in an Environment Containing Iodine...

... This review describes the examination of micro-volumes of material for the purpose of determining their chemistry, structure, and morphology. The techniques discussed encompass a broad range of capability, such as electron probe analysis (EPA), scanning electron microscopy (SEM), transmission...

... performance of a spectrometer (200 eV FWHM resolution for 6.404 keV radiation) is demonstrated for both X-ray and electron specimen excitation. spectroscopy spectrometers X-ray spectrometers chemical analysis X-ray spectra X-ray analysis electron probes energy bands wavelength X-ray...

..., or when scattering of incident X-rays or gamma rays occurs is discussed. dispersing X-ray analysis X-ray fluorescence electron probes scanning electron microscopy transmission electron microscopy electron beams radioactive isotopes X-ray tubes X-ray spectra electronic noise semiconductor...

... and peak overlap. spectroscopy solid state devices semiconductors (materials) X-ray spectra electron probes background noise quantitative analysis X-ray analysis scanning electron microscopes wavelengths spectrometers resolution data storage data processing Eric Lifshin 1 Solid-State...

... The scanning electron microscope is similar in many respects to the electron probe analyzer, but the scanning electron microscopist has a different goal and examines different specimens. The very low beam current of the scanning electron microscope requires the higher efficiency of the energy...

... above 1 keV, the solid-state detector appears to be worth developing for operation over the entire energy range. gas flow proportional counters chemical analysis X-ray analysis X-ray fluorescence electron probes solid state counters evaluation tests dispersing resolution spectrometers...

... Nondiffractive detector systems on electron probe microanalyzers have decreased the time required for a qualitative analysis from 30 or 40 min to 1 or 2 min. The nondiffractive technique may be extended to the quantitative determination of an element by comparing either the peak height...

... the optical microscope, the electron probe microanalyzer, the scanning electron microscope, and the transmission electron microscope. A brief discussion of color films is given. The technique used to obtain color photographs is given in detail for each aspect of color metallography discussed. color...

... reactor are presented. autoradiography ceramics construction materials electron microscopy electron probes heat treatment irradiation metallography microscopy microstructure nuclear fuel elements nuclear reactor photomicrography radioactive materials radiation shielding replicas R...

... of corrective procedures which can be used will be discussed. These include correction for absorption, fluorescence, and atomic number. electron beams electron probes metallography X-ray analysis evaluation Erwin Eichen, 1 Frank Kunz, 1 and Jack Tabock~ The Electron Microprobe Analyzer...

... The combination of electron microprobe X-ray emission spectrometry with the scanning techniques first developed for the scanning electron microscope permits using the scanning electron probe as a microscope sensitive to elemental composition. This technique is particularly useful in the many...

... The Washington Electron Probe Users' Group which consists of approximately 35 persons representing some twelve laboratories in the area was established in December, 1964. This group meets monthly for an informal exchange of information concerning current research practices and techniques...

... New and established applications of the electron probe microanalyzer are reviewed. A dominant theme apparent in recent publications is the complementary use of information from other analytical techniques with compositional data from the electron probe microanalyzer. The established applications...

... The magnitude of systematic and statistical errors in electron probe microanalysis due to faulty specimen preparation is discussed theoretically and experimentally. It is shown that this error increases as the energy of the X-ray line being monitored decreases and also as the X-ray emergence...

... oil is an important source of contamination in the electron microscope. electron microscopes electron probes metallography carburizing contamination diffusion pump oil evaporated iron thin-foil specimens A. Szirmae1 Specimen Carburization by Electron-Beam Contamination REFERENCE...