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Keywords: XUV
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Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1988
ISBN-10: 0-8031-4481-4
ISBN: 978-0-8031-4481-1
... deduce the pressure and coverage dependence as well as the growth rate for the initial monolayer arising from these surface reactions. In addition, extreme ultraviolet (XUV) reflectance vs angle of incidence measurements at 58.4 nm wavelength clearly indicate the growth of oxide on the surface of our...
