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Keywords: X-ray analysis
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eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1990
ISBN-10: 0-8031-1452-4
ISBN: 978-0-8031-1452-4
... method. The reaction is ascribed to the polycrystallinity of the quartz grains, as shown by electron diffraction (TEM) and by X-ray diffractometry, both showing a disorder in the crystalline structure. granitic rocks strained quartz expansion bars X-ray analysis TEM staining method C@sar R...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1988
ISBN-10: 0-8031-0975-X
ISBN: 978-0-8031-0975-9
... completes its primary objective of X-ray control and provides many other benefits. These will be described in detail from data collection to finished reports and graphic plots. Future modification to the system will be also discussed. quality control X-ray analysis computerization data bases...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1975
ISBN-10: 0-8031-5526-3
ISBN: 978-0-8031-5526-8
... from electron capture decay of 55 Fe have been observed in some of the samples. The techniques discussed are potentially applicable to a variety of problems related to the quality of environmental waters. water quality nuclear reactors electron microscopy X-ray analysis environmental tests...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1974
ISBN-10: 0-8031-0510-X
ISBN: 978-0-8031-0510-2
... deformation of beryllium crystals, the deformation and fracture of germanium and silicon crystals, and the elucidation of the distribution of microplastic and elastic strains in crack propagation. X-ray analysis transmission scanning electron microscopy deformation fractures (materials) germanium...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
... performance of a spectrometer (200 eV FWHM resolution for 6.404 keV radiation) is demonstrated for both X-ray and electron specimen excitation. spectroscopy spectrometers X-ray spectrometers chemical analysis X-ray spectra X-ray analysis electron probes energy bands wavelength X-ray...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
... spectrometers will be given and compared with the theoretical limitations. Finally, future possibilities in the development of X-ray energy analyzers will be assessed. semiconductor devices spectrometers silicon germanium X-ray spectra X-ray analysis electromagnetic noise cryogenics preamplifiers...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
... variable is emphasized. semiconductors (materials) semiconductor devices X-ray spectrometers X-ray analysis preamplifiers amplifiers resolution performance F. J. Walter I Characterization of Semiconductor X-ray Energy Spectrometers REFERENCE: Walter, F. J., "Characterization...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
... The components of the energy dispersion X-ray analysis system are discussed, and the electronic noise of peak broadening due to each is identified. Data on count rates and sensitivity are listed for various elements to enable the prospective user to determine whether the technique is applicable...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
... of the multichannel analyzers will be able to incorporate units in their system that will perform the present and future functions of their applications. X-ray spectrometers analog computers digital computers electron microscopy X-ray spectra X-ray analysis address scaler analog to digital converter...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
... and peak overlap. spectroscopy solid state devices semiconductors (materials) X-ray spectra electron probes background noise quantitative analysis X-ray analysis scanning electron microscopes wavelengths spectrometers resolution data storage data processing Eric Lifshin 1 Solid-State...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
... and operating an energy dispersion X-ray system. scanning electron microscopes electron probes spectrometers dispersing X-ray analysis X-ray spectra resolution electron beams X-ray diffraction quantitative analysis J. C. Russ I Energy Dispersion X-ray Analysis on the Scanning Electron...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
... beams electron diffraction solid state devices X-ray analysis scattering dispersing resolution spectrochemical analysis S. L. Bender 1 and R. H. DufJ ~ Energy Dispersion X-ray Analysiswith the Transmission Electron Microscope REFERENCE: Bender, S. L. and Duff, R. H., "Energy Dispersion X-ray...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
... above 1 keV, the solid-state detector appears to be worth developing for operation over the entire energy range. gas flow proportional counters chemical analysis X-ray analysis X-ray fluorescence electron probes solid state counters evaluation tests dispersing resolution spectrometers...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1971
ISBN-10: 0-8031-0070-1
ISBN: 978-0-8031-0070-1
... Dispersion X-ray Analysis: X-ray and Electron Probe Analysis, ASTM STP 485, American Society for Testing and Materials, 1971, pp. 243-285. ABSTRACT: This paper reviews the present state of development and application of X-ray emission spectrometry using radioisotope X-ray and gamma ray sources for excitation...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1970
ISBN-10: 0-8031-0747-1
ISBN: 978-0-8031-0747-2
... wavelength X-ray analysis. crystals metallography metallurgy microstructure X-ray analysis evaluation J. B. Newkirk I Advances in X-ray Metallography REFERENCE: Newkirk, J. B., "Advances in X-ray Metaliography," Applications of Modern Metallographic Techniques, ASTM STP 480, American Society...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1970
ISBN-10: 0-8031-0747-1
ISBN: 978-0-8031-0747-2
... of corrective procedures which can be used will be discussed. These include correction for absorption, fluorescence, and atomic number. electron beams electron probes metallography X-ray analysis evaluation Erwin Eichen, 1 Frank Kunz, 1 and Jack Tabock~ The Electron Microprobe Analyzer...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1968
ISBN-10: 0-8031-6181-6
ISBN: 978-0-8031-6181-8
... of the country. metallography electron probes interlaboratory tests X-ray analysis spectrochemical analysis L. S. Birks, I J. V. Gil[rich,2 and H. Yakowitz 3 Report of the Washington Electron Probe Users' Group REFERENCE: L. S. Birks, J. V. Gilfrich, and H. Yakowitz, "Report of the Washington...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1968
ISBN-10: 0-8031-6181-6
ISBN: 978-0-8031-6181-8
... nonelemental standards are required are outlined. The choice of standards for various types of work is discussed. specimen preparation electron probes metallography petrography microanalysis X-ray analysis H. Yakowitz 1 Evaluation of Specimen Preparation and the Use of Standards in Electron Probe...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1968
ISBN-10: 0-8031-6641-9
ISBN: 978-0-8031-6641-7
... thin sections are taken permits the investigation of possible access routes for chemical attack. radiography X-ray analysis microradiography graphite structure graphite L. R. Bunnell1 Contact Microradiography of Graphite* REFERENCE: Bunnell, L. R., "Contact Microradiography of Graphite...
eBook Chapter
Series: ASTM Selected Technical Papers
Publisher: ASTM International
Published: 1968
ISBN-10: 0-8031-6641-9
ISBN: 978-0-8031-6641-7
... photographic emulsion allows contact microradiography to be performed on miniature specimens with a resolution of one micron. X-ray analysis radiography microradiography graphite coatings R. W. McClung1 Low Voltage Radiographic and Micoradiographic Techniques for Graphite* REFERENCE: McClung, R. W...