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ASTM Selected Technical Papers
Emerging Semiconductor Technology
By
DC Gupta
DC Gupta
Symposium Chairman and Co-Editor
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ISBN-10:
0-8031-0459-6
ISBN:
978-0-8031-0459-4
No. of Pages:
719
Publisher:
ASTM International
Publication date:
1987

Semiconductor device miniaturization has required continually decreasing levels of particulate contamination in process gases. This paper briefly reviews existing technologies for analyzing and for minimizing particles in VLSI gas streams. Recent advances and research topics in both areas are also addressed. Examples from laboratory and field evaluations of VLSI and non-VLSI systems are discussed.

1.
Willeke
,
K.
and
Liu
,
B. Y.H.
, “
Single Particle Optical Counters: Principles and Applications
,” in
Fine Particles
,
Liu
B. Y.H.
, Ed.,
Academic Press
,
New York
,
1976
, pp. 698-729.
2.
Knollenberg
,
R. G.
, “
The Measurement of Particle Sizes Below 0.1 Micrometers
,” presented at the
30th Annual Meeting of the Institute of Environmental Sciences
,
Orlando, Florida
,
1984
, and published in the
Proceedings
,
Institute of Environmental Sciences
,
Chicago, Illinois
.
3.
Keady
,
P. B.
,
Quant
,
F. R.
and
Sem
,
G.
, “
Differential Mobility Particle Sizer
,”
TSI Quarterly
, Vol.
9
, No.
2
, April–June 1983, pp. 3-11.
4.
Fuchs
,
N. A.
, “
Sampling of Aerosols
,” in
Atmospheric Environment
, Vol.
9
,
Permagon Press
,
London
,
1975
, pp. 697-707.
5.
Liu
,
B. Y.H.
,
Pui
,
D. Y.H.
and
Rubow
,
K. L.
, “
Characteristics of Air Sampling Filter Media
,” in
Aerosols in the Mining and Industrial Work Environment
,
Marple
V. A.
and
Liu
B. Y.H.
, Eds.,
Ann Arbor Science Publishers
,
Ann Arbor
,
1983
, pp. 989-1083.
6.
Kruger
,
J.
and
Frankenthal
,
R. P.
, Eds.,
Passivity of Metals
,
John Wiley & Sons
,
New York
,
1978
.
7.
Leidheiser
, ,
H.
 Jr.
,
The Corrosion of Copper, Tin and Their Alloys
,
John Wiley & Sons
,
New York
,
1971
.
8.
Hinds
,
W. C.
,
Aerosol Technology
,
John Wiley & Sons
,
New York
,
1982
.
9.
Bowling
,
R. A.
, “
An Analysis of Particle Adhesion on Semiconductor Surfaces
,”
Journal of the Electrochemical Society
 0013-4651, Vol.
132
, No.
9
,
09
1985
, pp. 2208-2214.
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