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ASTM Selected Technical Papers
Laser Induced Damage In Optical Materials: 1983
By
HE Bennett,
HE Bennett
1
Naval Weapons Center
?China Lake, California 93555
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AH Guenther,
AH Guenther
2
Air Force Weapons Laboratory Kirtland Air Force Base
, New Mexico 87117
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D Milam,
D Milam
3
Lawrence Livermore National Laboratory
?Livermore, California 94550
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BE Newnam
BE Newnam
4
Los Alamos National Laboratory
?Los Alamos, New Mexico 87545
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ISBN-10:
0-8031-0930-X
ISBN:
978-0-8031-0930-8
No. of Pages:
584
Publisher:
ASTM International
Publication date:
1985
eBook Chapter
Laser Induced Damage of a Thin Film With an Absorbing Inclusion: Thermal Considerations of Substrates and Absorption Profiles
By
MR Lange
,
MR Lange
1
Institute for Modern Optics, University of New Mexico
Albuquerque,
New Mexico
87131
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JK McIver
,
JK McIver
1
Institute for Modern Optics, University of New Mexico
Albuquerque,
New Mexico
87131
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AH Guenther
AH Guenther
2
Air Force Weapons Laboratory Kirtland Air Force Base
, New Mexico
87115
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Page Count:
6
-
Published:1985
Citation
Lange, M, McIver, J, & Guenther, A. "Laser Induced Damage of a Thin Film With an Absorbing Inclusion: Thermal Considerations of Substrates and Absorption Profiles." Laser Induced Damage In Optical Materials: 1983. Ed. Bennett, H, Guenther, A, Milam, D, & Newnam, B. 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959 : ASTM International, 1985.
Download citation file:
A study of pulsed laser induced damage to thin films is conducted within the context of the impurity-dominated damage model in which the thin film component of the model is emphasized. In this case, a cylindrical impurity is embedded in a single thin film layer between a free surface and a substrate. The effect of the substrate is studied by varying its thermal properties with respect to those of the thin film. The nonuniform distribution of radiation in the film is incorporated into the model by assuming that the absorption is proportional to the standing wave intensity pattern of the field. These results are compared to the results found in previous studies of impurities embedded in infinite mediums.
5. References
1.
Walker
T. W.
, Guenther
A. H.
and Nielsen
P. E.
, “Pulsed Laser-Induced Damage to Thin-Film Optical Coatings
”, IEEE J. Quant. Electron.
17
(10
); 1980 October.2.
Lange
M. R.
, McIver
J. K.
and Guenther
A. H.
, “Laser Damage Threshold Predictions Based on the Effects of Thermal and Optical Properties Employing a Spherical Impurity Model
”, NBS Spec. Pub.
(This Edition); 1983
.3.
Guenther
Karl
, “Nodular Defects in Dielectric Multilayers and Thick Single Layers
, Appl. Opt.
20
(6
); 1034-1038; 1981
.4.
McLeon
H. Angus
, “Microstructure of Optical Thin Films
”, SPIE
325
; 21-28; 1982
.5.
Lange
M. R.
, McIver
J. K.
and Guenther
A. H.
, “Pulsed Laser Induced Damage of an Optical Material With a Spherical Inclusions: Influence of the Thermal Properties of the Materials
”, Eds., Bennett
H. E.
, Guenther
A. H.
, Milam
D.
, and Newnam
B. E.
; NBS Spec. Pub.
669
; 380-386; 1982
.
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