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ASTM Selected Technical Papers
Laser Induced Damage In Optical Materials: 1983
By
HE Bennett,
HE Bennett
1
Naval Weapons Center
?China Lake, California 93555
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AH Guenther,
AH Guenther
2
Air Force Weapons Laboratory Kirtland Air Force Base
, New Mexico 87117
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D Milam,
D Milam
3
Lawrence Livermore National Laboratory
?Livermore, California 94550
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BE Newnam
BE Newnam
4
Los Alamos National Laboratory
?Los Alamos, New Mexico 87545
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ISBN-10:
0-8031-0930-X
ISBN:
978-0-8031-0930-8
No. of Pages:
584
Publisher:
ASTM International
Publication date:
1985
eBook Chapter
Predamage Threshold Electron Emission from Insulator and Semiconductor Surfaces
By
WJ Siekhaus
,
WJ Siekhaus
1
Lawrence Livermore National Laboratory
Livermore, California 94550
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JH Kinney
,
JH Kinney
1
Lawrence Livermore National Laboratory
Livermore, California 94550
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D Milam
D Milam
1
Lawrence Livermore National Laboratory
Livermore, California 94550
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Page Count:
6
-
Published:1985
Citation
Siekhaus, W, Kinney, J, & Milam, D. "Predamage Threshold Electron Emission from Insulator and Semiconductor Surfaces." Laser Induced Damage In Optical Materials: 1983. Ed. Bennett, H, Guenther, A, Milam, D, & Newnam, B. 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959 : ASTM International, 1985.
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Predamage electron emission shows a dependence on fluence, bandgap and wavelength consistent with multiphoton excitation across the bandgap and inconsistent with avalanche ionization and thermionic emission models. The electron emission scales with pulselength as τ−1/2.
6 References
1.
Smith
W. L.
, “Laser-Induced Breakdown in Optical Materials
,” Optical Engineering
17
, 489 (1978
), Glass
A. J.
, and Guenther
A. H.
, Eds., NBS Special Publication 509
.2.
Brawer
S.
, “Phenomenological Theory of Laser Induced Damage in Insulators
,” Phys. Rev.
B20
, 3422, (1979
).3.
Alyassini
N.
and Parks
J. H.
, J. Appl. Phys.
0021-8979 48
, 629 (1977
).4.
Krutyakova
V. P.
and Smitnov
V. N.
, Sov. Phys. Tech. Phys.
24
(9
) 09
1979
.5.
Milam
D.
, “Measurement and Identification of Laser Damage Thresholds in Thin Films
,” Proceeding of the Society of Photo-Optical Instrumentation Engineers
, Vol. 140
, Optical Coatings II (1978
).6.
Smith
W. L.
, DeGroot
A. J.
, and Weber
M. T.
, “Silicon Vidicon Systems for Measuring Laser Intensity Profiles
,” Appl. Opt.
17
, 3938 (1978
).
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