Skip to Main Content
Skip Nav Destination
ASTM Selected Technical Papers
Laser Induced Damage In Optical Materials: 1983
By
HE Bennett
HE Bennett
1
Naval Weapons Center
?
China Lake, California 93555
Search for other works by this author on:
AH Guenther
AH Guenther
2
Air Force Weapons Laboratory Kirtland Air Force Base
,
New Mexico 87117
Search for other works by this author on:
D Milam
D Milam
3
Lawrence Livermore National Laboratory
?
Livermore, California 94550
Search for other works by this author on:
BE Newnam
BE Newnam
4
Los Alamos National Laboratory
?
Los Alamos, New Mexico 87545
Search for other works by this author on:
ISBN-10:
0-8031-0930-X
ISBN:
978-0-8031-0930-8
No. of Pages:
584
Publisher:
ASTM International
Publication date:
1985

For high quality laser optics it is important to compare measurements of surface quality made in different laboratories, determine how scattering levels of silver coatings produced by different groups compare, and what effects, if any, are introduced by stripping the silver coatings and by handling and transporting samples between laboratories. A round-robin study attempted to answer these questions. Participating laboratories included the Avionics Laboratory at the Air Force Wright Aeronautical Laboratories (AFWAL), Dayton, Ohio, Michelson Laboratory at the Naval Weapons Center (NWC), China Lake, California, and the Air Force Weapons Laboratory (AFWL), Albuquerque, New Mexico. Fourteen very low-scatter, optically polished synthetic fused silica (Suprasil) and natural fused quartz (Homosil) samples were purchased from Robert M. Silva of VTI, Dayton, Ohio. Angular scattering, i.e., bidirectional reflectance distribution function (BRDF), was measured on all the uncoated samples and three silver-coated samples at AFWAL using a variable angle scatterometer. Eleven additional samples were silver coated at NWC, and total integrated scattering (TIS) was measured on all silver-coated samples. Transmission electron micrographs were made of the surfaces (silvered and also stripped) of two samples, and selected coated and uncoated samples were profiled. TIS was then measured on the instrument at AFWL. At AFWAL BRDF measurements were made on all the samples, both silver coated and then stripped, and TIS measurements were repeated on selected samples at NWC. It was found that the TIS measurements made at NWC and AFWL were in good agreement. Scattering from bare substrates increased after silver coating and stripping, and there was a large variability in the silver coatings, particularly those made at NWC. Critical factors in obtaining low-scatter silver surfaces appeared to be the cleaning and coating of the samples. The results of the round-robin measurements are discussed in detail in this paper.

1.
Nicodemus
,
F. E.
;
Richmond
,
J. C.
;
Hsia
,
J. J.
;
Ginsberg
,
I. W.
; and
Limperis
,
T.
Geometrical considerations and nomenclature for reflectance
,’
NBS Monograph
160
; 5-6;
1977
.
2.
Orazio
,
F. D.
 Jr.
;
Silva
,
R. M.
; and
Stowell
,
W. K.
Instrumentation of a variable angle scatterometer
,”
Proc. SPIE
384
; 123-131;
1983
.
3.
Silva
,
R. M.
;
Orazio
,
F. D.
 Jr.
; and
Stowell
,
W. K.
Scatter evaluation of supersmooth surfaces
,”
Proc. SPIE
384
; 2-9;
1983
.
4.
Stowell
,
W. K.
; and
Orazio
,
F. D.
 Jr.
Damage effects identified by scatter evaluation
,”
Proc. SPIE
406
; 23-42;
1983
.
5.
Bennett
,
H. E.
Scattering characteristics of optical materials
,”
Opt. Engr.
17
; 480-488;
1978
.
6.
Archibald
,
P. C.
; and
Bennett
,
H. E.
Scattering from infrared missile domes
,”
Opt. Engr.
17
; 647-651;
1978
.
7.
Bennett
,
J. M.
; and
Dancy
,
J. H.
Stylus profiling instrument for measuring statistical properties of smooth optical surfaces
,”
Appl. Opt.
20
; 1785-1802;
1981
.
8.
Bennett
,
J. M.
Measurement and interpretation of fine form errors in optical surfaces
,”
Symposium on Optical Surface Technology
; 12–14 April 1983;
Garmisch, Germany
. Proceedings to be published by SPIE.
9.
Elson
,
J. M.
; and
Rahn
,
J. P.
Private communication;
1983
.
This content is only available via PDF.
You do not currently have access to this chapter.
Close Modal

or Create an Account

Close Modal
Close Modal