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ASTM Selected Technical Papers
Laser Induced Damage In Optical Materials: 1980
By
HE Bennett
HE Bennett
1
Naval Weapons Center
?
China Lake, California 93555Co-Chairmen
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AJ Glass
AJ Glass
2
Lawrence Livermore Laboratories
?
Livermore, California 94550Co-Chairmen
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AH Guenther
AH Guenther
3
Air Force Weapons Laboratory, Kirtland Air Force Base
,
New Mexico 87117Co-Chairmen
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BE Newnam
BE Newnam
4
Los Alamos Scientific Laboratory
?
Los Alamos, New Mexico 87545Co-Chairmen
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ISBN-10:
0-8031-4500-4
ISBN:
978-0-8031-4500-9
No. of Pages:
487
Publisher:
ASTM International
Publication date:
1981

The beam of a 3 ns pulse laser (1060 nm) is focussed with a convex lense with 1,1 m focal length. The glass sample to be tested is 20 mm thick: its rear surface has a distance of 100 mm from the focus. The part of the sample which will be shot is illuminated with a Xenon lamp and inspected with a microscope with four fold magnification before and after the shot. In each case a photo is taken.

Two types of internal damage are to be recognized: pointlike damage and threadlike damage. Some glass types show only pointlike damage, even at higher energies (applied energy densities up to 65 J/cm2); other glass types show only threadlike damage caused by self-focussing (dependent to the n2-value). In the most cases both damage types occur but at different levels of energy densities. In BK 1 and BK 7 glass no internal damage is to be seen when applying energy densities up to 65 J/cm2.

1.
Glass
,
A. J.
,
Guenther
,
A. H.
,
Laser induced damage in optical materials: tenth ASTM symposium
,
Appl. Opt.
 0003-6935 
18
, 2112 (
1979
)
2.
Stokowski
,
S. E.
,
Milam
,
D.
,
Weber
,
M. J.
,
Laser induced damage in fluoride glasses: a status report
, NBS Special Publication 541,
1978
3.
Milam
,
D.
,
Measurement and identification of laser-damage thresholds in thin films
, presented at the
S.P.I.E. Technical Symposium East
,
Washington, DC
(March 28–30, 1978)
4.
Milam
,
D.
,
Lowdermilk
,
W. H.
,
Wirtenson
,
G. R.
, Laser damage testing at LLL an overview and an update,
Proceedings of Electro-Optics/Laser 78
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