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ASTM Selected Technical Papers
Impediments to Analysis
By
JE Foster
JE Foster
1
Kawecki Berylco Industries, Inc.
, Boyertown, Pa. 19512
; editor
.
Search for other works by this author on:
ISBN-10:
0-8031-0374-3
ISBN:
978-0-8031-0374-0
No. of Pages:
103
Publisher:
ASTM International
Publication date:
1980
Description
This volume brings to the forefront some of the problems, which the analytical chemist encounters on a regular basis. These impediments to quality analytical determinations range in nature from objectivity and judgment of the analyst to the technical limitations of procedures and equipment.
Foster, J.
Impediments to Analysis. ISBN-10: 0-8031-0374-3
ISBN: 978-0-8031-0374-0
No. of Pages: 103
ISBN (electronic): 978-0-8031-4776-8
Publisher: ASTM International
Published: 1980
Download citation file:
Table of Contents
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IntroductionByJE FosterJE Foster1Kawecki Berylco Industries, Inc.,Boyertown, Pa. 19512;editor.Search for other works by this author on:
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The Analytical Chemist: His Own Worst EnemyByFP ByrneFP Byrne1visiting professor,Western Kentucky University,Bowling Green, Ky. 42101.Search for other works by this author on:
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Limiting Factors in the Spectrophotometric Analysis of Minor Components of Blended Metal PowdersByAC Javier-Son,AC Javier-Son1Technical services and quality assurance manager,Bulkweld Division, Tapco International,Houston, Tex.77040.Search for other works by this author on:EJ Kachelmeier,EJ Kachelmeier2President,Kachelmeier Innovative Technology, Inc.,Houston, Tex. 77055.Search for other works by this author on:GH ReynoldsGH Reynolds3Metallurgical engineer,Materials Sciences Northwest, Inc.,Corvallis, Ore. 97330.Search for other works by this author on:
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Impediments in the Characterization of Copper-Nickel-Tin Spinodal Alloys by Atomic Absorption SpectrometryByTY KometaniTY Kometani1Analytical chemist,Bell Laboratories, Analytical Chemistry Department,Murray Hill, N.J. 07974.Search for other works by this author on:
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Assessment of the Accuracy of Spectrophotometric Measurements and MethodologiesByRW Burke,RW Burke1Research chemists,Center for Analytical Chemistry, National Measurement Laboratory, National Bureau of Standards,Washington, D.C. 20234.Search for other works by this author on:R MavrodineanuR Mavrodineanu1Research chemists,Center for Analytical Chemistry, National Measurement Laboratory, National Bureau of Standards,Washington, D.C. 20234.Search for other works by this author on:
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Contamination Control in Trace Element AnalysisByM ZiefM Zief1Principal scientist for purification,J. T. Baker Chemical Company,Phillipsburg, N.J. 08865.Search for other works by this author on:
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The Echelle Spectrograph as a Solution to Some Problems Commonly Encountered in Other Instrumental AnalysisByJR ShopeJR Shope1Analytical supervisor,Kawecki Berylco Industries, Inc.,Boyertown, Pa. 19512.Search for other works by this author on:
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The Quality of Analysis Depends on Written ProceduresByWA RoweWA Rowe1Manager,Research Services, Gould Laboratories—Energy Research,Rolling Meadows, Ill. 60008.Search for other works by this author on:
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© 1980
ASTM International
