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ASTM Selected Technical Papers
Semiconductor Measurement Technology: Spreading Resistance Symposium
By
James R. Ehrstein
James R. Ehrstein
Editor
1Electronic Technology Division, Institute for Applied Technology,
National Bureau of Standards
, Washington, D.C., 20234
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ISBN-10:
0-8031-6661-3
ISBN:
978-0-8031-6661-5
No. of Pages:
297
Publisher:
ASTM International
Publication date:
1974
Citation
"Front Matter." Semiconductor Measurement Technology: Spreading Resistance Symposium. Ed. Ehrstein, JR. 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959 : ASTM International, 1974.
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