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ASTM Selected Technical Papers
Energy Dispersion X-Ray Analysis: X-Ray and Electron Probe Analysis
By
JC Russ
JC Russ
1
Jeolco (USA), Inc.
,
Medford, Mass. 02155
;
symposium chairman
.
Search for other works by this author on:
ISBN-10:
0-8031-0070-1
ISBN:
978-0-8031-0070-1
No. of Pages:
287
Publisher:
ASTM International
Publication date:
1971

The components of the energy dispersion X-ray analysis system are discussed, and the electronic noise of peak broadening due to each is identified. Data on count rates and sensitivity are listed for various elements to enable the prospective user to determine whether the technique is applicable to his specimens. Specific comparison is made between the use of electron beams, radioactive isotopes, and X-ray tubes to excite the characteristic X-ray lines of interest. The ability to distinguish small peaks when Bremsstrahlung (white radiation) is present due to the use of direct electron excitation, or when scattering of incident X-rays or gamma rays occurs is discussed.

1.
Goulding
F. S.
, to be published.
2.
McKensie
,
Kern
, “
Noise Studies of Ceramic Encapsulated Junction Field Effect Transistors
,”
Transactions on Nuclear Science, Institute of Electrical and Electronic Engineers
 0018-9499. Vol.
NS-17
, No.
3
,
06
1970
.
3.
Goulding
,
F. S.
,
Walton
,
J.
, and
Malone
,
D. F.
, “
An Optoelectronic Feedback Preamplifier for High Resolution Spectroscopy
,”
Lawrence Radiation Laboratory
, UCRL-18698.
4.
Goulding
,
F. S.
,
Walton
,
J.
, and
Pehl
,
R. H.
, “
Recent Results on the Optoelectronic Feedback Preamplifier
,”
Transactions on Nuclear Science, Institute of Electrical and Electronic Engineers
 0018-9499, Vol.
NS-17
, No.
3
,
06
1970
.
5.
Aitken
and
Zulliger
, “
Fano Factor Fact and Fallacy
,”
Transactions on Nuclear Science, Institute of Electrical and Electronic Engineers
 0018-9499, Vol.
NS-17
, No.
3
,
06
1970
.
6.
Lifshin
E.
, Technical Information Series Report 69-C-346,
General Electric Co.
,
10
1969
.
7.
Sutfin
,
L. V.
and
Ogilvie
,
R. E.
, “
A Comparison of X-ray Analysis Techniques Available for Scanning Electron Microscopes
,”
Proceedings of the Third SEM Symposium
,
Chicago
,
04
1970
.
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