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ASTM Selected Technical Papers
Energy Dispersion X-Ray Analysis: X-Ray and Electron Probe Analysis
By
JC Russ
JC Russ
1
Jeolco (USA), Inc.
, Medford, Mass. 02155
; symposium chairman
.
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ISBN-10:
0-8031-0070-1
ISBN:
978-0-8031-0070-1
No. of Pages:
287
Publisher:
ASTM International
Publication date:
1971
eBook Chapter
X-Ray Energy Spectrometry in the 0.1 to 10 Å Range
By
R Fitzgerald
,
R Fitzgerald
1
Lecturer
, Applied Physics and Information Science, University of California
, San Diego, Calif
.
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P Gantzel
P Gantzel
2
Chemist
, Gulf General Atomic Incorporated
, San Diego, Calif
.
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Page Count:
33
-
Published:1971
Citation
Fitzgerald, R, & Gantzel, P. "X-Ray Energy Spectrometry in the 0.1 to 10 Å Range." Energy Dispersion X-Ray Analysis: X-Ray and Electron Probe Analysis. Ed. Russ, J. 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959 : ASTM International, 1971.
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Energy spectrometry utilizing a solid-state detector (silicon) for X-ray elemental analysis is described, and compared with wavelength spectrometry.
Parameters which influence the spectrometers energy resolution, energy detection range, and countrate capabilities are reviewed. Measured performance of a spectrometer (200 eV FWHM resolution for 6.404 keV radiation) is demonstrated for both X-ray and electron specimen excitation.
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