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ASTM Selected Technical Papers
Applications of Modern Metallographic Techniques
By
ASTM Committee E-4
ASTM Committee E-4
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ISBN-10:
0-8031-0747-1
ISBN:
978-0-8031-0747-2
No. of Pages:
280
Publisher:
ASTM International
Publication date:
1970

The use of an electron microprobe as a research tool will be considered. The theory of operation of this instrument will be briefly discussed. The different possible modes of data presentation will be given. These will include graphical representation on a recorder, video representation of scanned area using backscattered electrons, absorbed electrons, and X-rays, and the accumulation of quantitative data on scalers. Qualitative, semiquantitative, and quantitative analysis will be included in the discussion. Also included will be the importance of specimen preparation in microprobe analysis, and a number of different examples for various types of specimens will be given. These will include such materials as metals, glasses, ceramics, and semiconductors. Consideration will be given to the analysis of thin films as well as bulk materials. Some of the problems encountered in the analysis of thin films will be discussed as well as ways of circumventing these problems. Examples will be given to illustrate the type of problems and the means of approach in cases where qualitative analysis, semiquantitative analysis, and quantitative analysis are desired. In the latter case, the different types of corrective procedures which can be used will be discussed. These include correction for absorption, fluorescence, and atomic number.

1.
Castaing
,
R.
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University of Paris
, Paris,
1951
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2.
X-ray and Electron Probe Analysis
, ASTM STP 349,
American Society for Testing and Materials
,
1964
.
3.
Birks
,
L. S.
in
X-ray and Electron Probe Analysis
, ASTM STP 349,
American Society for Testing and Materials
,
1964
, p. 158.
4.
Heinrich
,
K. F. J.
in
X-ray and Electron Probe Analysis
, ASTM STP 349,
American Society for Testing and Materials
,
1964
, p. 171.
5.
Brown
,
J. D.
in
Fifty Years of Progress in Metallographic Techniques
, ASTM STP 430,
American Society for Testing and Materials
,
1968
, p. 354.
6.
Heinrich
,
K. F. J.
in
Fifty Years of Progress in Metallographic Techniques
, ASTM STP 430,
American Society for Testing and Materials
,
1968
, p. 315.
7.
Criss
,
J.
, “
Advances in Quantitative Electron Probe Microanalysis
,” 72nd Annual Meeting,
American Society for Testing and Materials
,
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,
06
1966
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8.
Heinrich
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in
The Electron Microprobe
,
McKinley
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et al, Eds.,
John Wiley
,
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,
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, p. 841.
9.
Reed
,
S. J. B.
in
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,
Castaing
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et al, Eds.,
Hermann
,
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,
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, p. 339.
10.
Yakowitz
,
H.
and
Heinrich
,
K. F. J.
,
Journal of Research of the National Bureau of Standards, Section A, JNBAA
, Vol.
73A
,
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, p. 113.
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Heinrich
,
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,
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33
,
1962
, p. 884.
12.
Fitzgerald
,
R.
,
Keil
,
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and
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,
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,
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,
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13.
Castaing
,
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,
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, Vol.
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,
Marton
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, Ed.,
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,
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,
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, p. 317.
14.
Wittry
,
D. B.
, PhD thesis,
California Institute of Technology
,
1957
.
15.
Duncumb
,
P.
and
Shields
,
P. K.
,
British Journal of Applied Physics, BJAPA
 0508-3443, Vol.
14
,
1963
, p. 617.
16.
Henoc
,
J.
, “
Fluorescence by the Continuum
,” presented at Midwestern Probe Users Group Meeting,
Rochester, Minn.
,
06
1969
.
17.
Brown
J. D.
, “
Continuum Fluorescence: Is it Important?
,” presented at the Fourth National Conference on Electron Microprobe Analysis,
Electron Probe Analysis Society of America
,
Pasadena, Calif.
,
1969
.
18.
Wittry
,
D. B.
, “
Fluorescence by Characteristic Radiation in Electron Probe Microanalysis
,” USCEC Report 84-204,
University of Southern California
,
07
1962
.
19.
Reed
,
S. J. B.
,
British Journal of Applied Physics, BJAPA
 0508-3443, Vol.
16
,
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, p. 913.
20.
Philibert
,
J.
in
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,
Patee
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et al, Eds.,
Academic Press
,
New York
,
1963
, p. 379.
21.
Duncumb
,
P.
and
Shields
,
P. K.
in
The Electron Microprobe
,
McKinley
T. D.
et al, Eds.,
John Wiley
,
New York
,
1966
, p. 284.
22.
Thomas
,
P. M.
, “
A Method for Correcting for Atomic Number Effects in Electron Probe Microanalysis
,” AERE Report 4593,
Atomic Energy Research Establishment
, Berkshire, England,
04
1964
.
23.
Duncumb
,
P.
and
Reed
,
S. J. B.
, National Bureau of Standards, Special Publ. No. 298,
Seminar on Electron Probe Microanalysis
,
Proceedings
,
Washington, D. C.
,
1968
.
24.
Belk
,
J. A.
in
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,
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et al, Eds.,
Hermann
,
Paris
,
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, p. 214.
25.
Philibert
,
J.
and
Tixier
,
R.
,
British Journal of Applied Physics, BJAPA
 0508-3443, Vol.
19
,
1968
, p. 685.
26.
Ziebold
,
T. O.
and
Ogilvie
,
R. E.
,
Analytical Chemistry, ANCHA
 0003-2700, Vol.
35
,
1963
, p. 621.
27.
Beaman
,
D. R.
,
Analytical Chemistry, ANCHA
 0003-2700, Vol.
39
,
1967
, p. 418.
28.
Poole
,
D. M.
, Special Publ. No. 298,
Seminar on Electron Probe Microanalysis
,
Proceedings
,
National Bureau of Standards
,
Washington, D. C
,
1968
.
29.
Beaman
,
D. R.
and
Isasi
,
J.
, “
A Critical Examination of Computer Programs Used in Quantitative Electron Microprobe Analysis
,” presented at the Fourth National Conference on Electron Microprobe Analysis,
Electron Probe Analysis Society of America
,
Pasadena, Calif.
,
1969
.
30.
Achter
,
M. R.
,
Birks
,
L. S.
and
Brooks
,
E. J.
,
Journal of Applied Physics, JAPIA
 0021-8979, Vol.
30
,
1959
, p. 1825.
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