Jacobs and Martini (JM) give a nice review of direct measurement methods (in situ electron microscopy), as well as indirect methods (which are based on contact resistance, contact stiffness, lateral forces, and topography) for measurement of the contact area, mostly at nanoscale. They also discuss simulation techniques and theories from single-contact continuum mechanics, to multicontact continuum mechanics and atomistic accounting. As they recognize, even at very small scales, “multiple-contacts” case occurs, and a returning problem is that the “real contact area” is often an ill-defined, “magnification” dependent quantity. The problem remains to introduce a truncation to the fractal roughness process, what was called in the 1970s “functional filtering.” The truncation can be “atomic roughness” or can be due to adhesion, or could be the resolution of the measuring instrument. Obviously, this also means that the strength (hardness) at the nanoscale is ill-defined. Of course, it is perfectly reasonable to fix the magnification and observe the dependence of contact area, and strength, on any other variable (speed, temperature, time, etc.).
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November 2017
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Discussion of “Measuring and Understanding Contact Area at the Nanoscale: A Review” (Jacobs, T. D. B., and Ashlie Martini, A., 2017, ASME Appl. Mech. Rev., 69(6), p. 060802)
M. Ciavarella,
M. Ciavarella
Department of Mechanics, Mathematics and Management,
Center of Excellence in Computational Mechanics,
Politecnico di BARI,
Viale Gentile 182,
Bari 70125, Italy
e-mail: michele.ciavarella@poliba.it
Center of Excellence in Computational Mechanics,
Politecnico di BARI,
Viale Gentile 182,
Bari 70125, Italy
e-mail: michele.ciavarella@poliba.it
Search for other works by this author on:
A. Papangelo
A. Papangelo
Department of Mechanical Engineering,
Hamburg University of Technology,
Hamburg 21073, Germany
e-mail: antonio.papangelo@poliba.it
Hamburg University of Technology,
Am Schwarzenberg-Campus 1
,Hamburg 21073, Germany
e-mail: antonio.papangelo@poliba.it
Search for other works by this author on:
M. Ciavarella
Department of Mechanics, Mathematics and Management,
Center of Excellence in Computational Mechanics,
Politecnico di BARI,
Viale Gentile 182,
Bari 70125, Italy
e-mail: michele.ciavarella@poliba.it
Center of Excellence in Computational Mechanics,
Politecnico di BARI,
Viale Gentile 182,
Bari 70125, Italy
e-mail: michele.ciavarella@poliba.it
A. Papangelo
Department of Mechanical Engineering,
Hamburg University of Technology,
Hamburg 21073, Germany
e-mail: antonio.papangelo@poliba.it
Hamburg University of Technology,
Am Schwarzenberg-Campus 1
,Hamburg 21073, Germany
e-mail: antonio.papangelo@poliba.it
Manuscript received September 23, 2017; final manuscript received October 3, 2017; published online November 2, 2017. Editor: Harry Dankowicz.
Appl. Mech. Rev. Nov 2017, 69(6): 065502 (3 pages)
Published Online: November 2, 2017
Article history
Received:
September 23, 2017
Revised:
October 3, 2017
Connected Content
This is a companion to:
Measuring and Understanding Contact Area at the Nanoscale: A Review
Citation
Ciavarella, M., and Papangelo, A. (November 2, 2017). "Discussion of “Measuring and Understanding Contact Area at the Nanoscale: A Review” (Jacobs, T. D. B., and Ashlie Martini, A., 2017, ASME Appl. Mech. Rev., 69(6), p. 060802)." ASME. Appl. Mech. Rev. November 2017; 69(6): 065502. https://doi.org/10.1115/1.4038188
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