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Proceedings Papers

Friction-Topography Correlations During Nanotribological Fatigue Testing of Bulk Polystyrene

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Jonathan W. Bender, Chris W. Gibbs
Proc. ASME. WTC2005, World Tribology Congress III, Volume 2, 763-764, September 12–16, 2005
Publisher: American Society of Mechanical Engineers
Paper No: WTC2005-63502
https://doi.org/10.1115/WTC2005-63502
View Paper titled, Friction-Topography Correlations During Nanotribological Fatigue Testing of Bulk Polystyrene
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Topics: Fatigue testing, Friction, Deformation, Energy dissipation, Fatigue, Fracture (Materials), Fracture (Process), Nanotribology, Polystyrene film, Scanning probe microscopy
Proceedings Papers

A Mechanism of Sliding on the Nanometer-Thick Ag Layers

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F. Honda, M. Goto
Proc. ASME. WTC2005, World Tribology Congress III, Volume 2, 429-430, September 12–16, 2005
Publisher: American Society of Mechanical Engineers
Paper No: WTC2005-63818
https://doi.org/10.1115/WTC2005-63818
View Paper titled, A Mechanism of Sliding on the Nanometer-Thick Ag Layers
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Topics: Atoms, Augers, Cycles, Diamonds, Electron diffraction, Electron spectroscopy, Film thickness, Friction, Particulate matter, Reflection
Proceedings Papers

Nanoscale Fretting Study by Scanning Probe Microscopy (Keynote)

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Michael Varenberg, Izhak Etsion, Grigory Halperin
Proc. ASME. WTC2005, World Tribology Congress III, Volume 2, 709-710, September 12–16, 2005
Publisher: American Society of Mechanical Engineers
Paper No: WTC2005-63233
https://doi.org/10.1115/WTC2005-63233
View Paper titled, Nanoscale Fretting Study by Scanning Probe Microscopy (Keynote)
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Topics: Nanoscale phenomena, Scanning probe microscopy, Calibration, Displacement, Friction, Probes, Stress
Proceedings Papers

Appling Micro Devices to Scanning Probe Microscopes for Micro/Nano Tribology Study (Keynote)

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Yasuhisa Ando, Shiraishi Naoki
Proc. ASME. WTC2005, World Tribology Congress III, Volume 2, 715-716, September 12–16, 2005
Publisher: American Society of Mechanical Engineers
Paper No: WTC2005-63642
https://doi.org/10.1115/WTC2005-63642
View Paper titled, Appling Micro Devices to Scanning Probe Microscopes for Micro/Nano Tribology Study (Keynote)
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Topics: Nanotribology, Scanning probe microscopy, Microelectromechanical systems, Silicon-on-insulator, Force sensors, Semiconductor wafers, Tribology
Proceedings Papers

Integrated Multi-Sensor Tribo-SPM Nano+Micro Tribo-Metrology

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Norm Gitis, Antanas Daugela, Jun Xiao, Michael Vinogradov
Proc. ASME. WTC2005, World Tribology Congress III, Volume 2, 719-720, September 12–16, 2005
Publisher: American Society of Mechanical Engineers
Paper No: WTC2005-63079
https://doi.org/10.1115/WTC2005-63079
View Paper titled, Integrated Multi-Sensor Tribo-SPM Nano+Micro Tribo-Metrology
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Topics: Atomic force microscopy, Coatings, Mechanical properties, Metrology, Nanoindentation, Optical microscopes, Scanning probe microscopy, Sensors, Thin films, Tribology
Proceedings Papers

Tribological Process Characterization With In-Situ Quantitative Nano-Scale Metrology

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Antanas Daugela, Alex Meyman, Vladimir Knyazik, Nikolai Yeremin
Proc. ASME. WTC2005, World Tribology Congress III, Volume 2, 803-804, September 12–16, 2005
Publisher: American Society of Mechanical Engineers
Paper No: WTC2005-63834
https://doi.org/10.1115/WTC2005-63834
View Paper titled, Tribological Process Characterization With In-Situ Quantitative Nano-Scale Metrology
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Topics: Finite element model, Imaging, Mechanical properties, Metrology, Nanoindentation, Nanoscale phenomena, Optical microscopes, Scanning probe microscopy, Semiconductor wafers, Tribology