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Proceedings Papers

Friction-Topography Correlations During Nanotribological Fatigue Testing of Bulk Polystyrene

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Jonathan W. Bender, Chris W. Gibbs
Proc. ASME. WTC2005, World Tribology Congress III, Volume 2, 763-764, September 12–16, 2005
Publisher: American Society of Mechanical Engineers
Paper No: WTC2005-63502
https://doi.org/10.1115/WTC2005-63502
View Paper titled, Friction-Topography Correlations During Nanotribological Fatigue Testing of Bulk Polystyrene
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Topics: Fatigue testing, Friction, Deformation, Energy dissipation, Fatigue, Fracture (Materials), Fracture (Process), Nanotribology, Polystyrene film, Scanning probe microscopy
Proceedings Papers

Nano-Tribology of a Polytetrafluoroethylene Transfer Films Using Molecular Dynamics Simulation and Microtribometry

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Inkook Jang, Pamela L. Dickrell, David L. Burris, W. Gregory Sawyer, Simon R. Phillpot, Susan B. Sinnott
Proc. ASME. WTC2005, World Tribology Congress III, Volume 2, 933-934, September 12–16, 2005
Publisher: American Society of Mechanical Engineers
Paper No: WTC2005-63881
https://doi.org/10.1115/WTC2005-63881
View Paper titled, Nano-Tribology of a Polytetrafluoroethylene Transfer Films Using Molecular Dynamics Simulation and Microtribometry
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Topics: Chain, Engineering simulation, Lubricants, Molecular dynamics, Molecular dynamics simulation, Nanotribology, Polymer nanocomposites, Polymers, Simulation, Tribology
Proceedings Papers

Low Friction Achieved Using Repulsive Van Der Waals Forces: A Nanotribology Study With Colloid Probe AFM

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A. A. Feiler, L. Bergstro¨m, M. W. Rutland
Proc. ASME. WTC2005, World Tribology Congress III, Volume 2, 841-842, September 12–16, 2005
Publisher: American Society of Mechanical Engineers
Paper No: WTC2005-64402
https://doi.org/10.1115/WTC2005-64402
View Paper titled, Low Friction Achieved Using Repulsive Van Der Waals Forces: A Nanotribology Study With Colloid Probe AFM
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Topics: Atomic force microscopy, Friction, Nanotribology, Probes, Van der Waals forces, Load bearing capacity
Proceedings Papers

Appling Micro Devices to Scanning Probe Microscopes for Micro/Nano Tribology Study (Keynote)

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Yasuhisa Ando, Shiraishi Naoki
Proc. ASME. WTC2005, World Tribology Congress III, Volume 2, 715-716, September 12–16, 2005
Publisher: American Society of Mechanical Engineers
Paper No: WTC2005-63642
https://doi.org/10.1115/WTC2005-63642
View Paper titled, Appling Micro Devices to Scanning Probe Microscopes for Micro/Nano Tribology Study (Keynote)
Open the PDF for Appling Micro Devices to Scanning Probe Microscopes for Micro/Nano Tribology Study (Keynote) in another window
Topics: Nanotribology, Scanning probe microscopy, Microelectromechanical systems, Silicon-on-insulator, Force sensors, Semiconductor wafers, Tribology