A comparison of two lateral force calibration techniques for friction force microscopy is presented. We used methods developed by Ogletree et.al. [1] and Ruan and Bhushan [2] to measure the friction response between the atomic force microscope (AFM) probe and a silicon sample and to obtain lateral force calibration factors. The factors were used to characterize the friction behavior and interfacial shear strength of a silicon nitride (Si3N4) probe-ultra high molecular weight polyethylene (UHMWPE) interface.

Volume Subject Area:
Micro- and Nanotribology
Topics:
Calibration, Friction, Microscopy, Atomic force microscopy, Probes, Molecular weight, Shear strength, Silicon, Silicon nitride ceramics
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Copyright © 2005
 by ASME
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