A comparison of two lateral force calibration techniques for friction force microscopy is presented. We used methods developed by Ogletree et.al.  and Ruan and Bhushan  to measure the friction response between the atomic force microscope (AFM) probe and a silicon sample and to obtain lateral force calibration factors. The factors were used to characterize the friction behavior and interfacial shear strength of a silicon nitride (Si3N4) probe-ultra high molecular weight polyethylene (UHMWPE) interface.
A Comparison of Lateral Calibration Techniques for Quantitative Friction Force Microscopy
Kanaga Karuppiah, KS, & Sundararajan, S. "A Comparison of Lateral Calibration Techniques for Quantitative Friction Force Microscopy." Proceedings of the World Tribology Congress III. World Tribology Congress III, Volume 2. Washington, D.C., USA. September 12–16, 2005. pp. 821-822. ASME. https://doi.org/10.1115/WTC2005-63988
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