Friction and nanoscratch tests were performed on amorphous carbon thin films deposited on silicon. The effect of process and conditions on CVD deposited films was studied. Coefficient of friction between the films was estimated by using a special oscillating microtribometer. The lateral force and maximum depth of scratching were measured during nanoscratch tests. The comparison of tribological behavior of the tested films is presented and discussed.
Amorphous Carbon Thin Films for Interfaces in MEMS
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Malyska, K, Erdemir, A, Chizhik, SA, Rymuza, Z, & Ratajczyk, L. "Amorphous Carbon Thin Films for Interfaces in MEMS." Proceedings of the World Tribology Congress III. World Tribology Congress III, Volume 2. Washington, D.C., USA. September 12–16, 2005. pp. 723-724. ASME. https://doi.org/10.1115/WTC2005-63147
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