A novel quantitative nano+micro tribometer with integrated AFM and optical microscope has been utilized to characterize tribological and mechanical properties of liquid and solid thin films and coatings, with in-situ monitoring their changes during micro and nano indentation, scratching, reciprocating, rotating and other tribology tests.

Volume Subject Area:
Micro- and Nanotribology
Topics:
Atomic force microscopy, Coatings, Mechanical properties, Metrology, Nanoindentation, Optical microscopes, Scanning probe microscopy, Sensors, Thin films, Tribology, Tribometers
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Copyright © 2005
 by ASME
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