Nanoscale Fretting Study by Scanning Probe Microscopy (Keynote)

Nanoscale fretting can be studied by using scanning probe microscopy (SPM) and a newly proposed “slip index” which provides unified approach to fretting on different scales. Various relevant issues such as production of colloidal probes and SPM calibration will be presented. Partial and gross slip nanoscale fretting tests with displacement amplitude from 5 to 500 nm and normal load from 15 to 28 μN will be described. Experiments show a substantial increase of the friction at the transition from partial to gross slip and a significant difference of damaged surfaces in the two fretting regimes.