This paper presents a novel experimental apparatus and a test method for measuring simultaneously quasi-static average longitudinal and shear magnetic-field-induced strain (MFIS) of Ni-Mn-Ga single crystals. The apparatus consists of an aluminum casing, a weight-controlled plunger, two displacement probes (one vertical and one lateral), and a torsion guide etc. Three Ni-Mn-Ga square prism samples were tested. Twin boundary bands were clearly visible after the application of magnetic field. A range of material properties were measured. These include: (a) magnetic anisotropy constant; (b) single variant magnetization curves for the easy and hard axes; (c) nonlinear compressive stress-strain curves for all three samples at room temperature; and (d) average longitudinal and shear MFIS curves versus magnetic field strength for three prism samples subject to various compressive external stresses.
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ASME 2016 Conference on Smart Materials, Adaptive Structures and Intelligent Systems
September 28–30, 2016
Stowe, Vermont, USA
Conference Sponsors:
- Aerospace Division
ISBN:
978-0-7918-5048-0
PROCEEDINGS PAPER
Characterization of Ni-Mn-Ga Shape Memory Single Crystals for Magnetic Properties and Magnetic Field Induced Shear and Normal Strains
Jademond Kiang,
Jademond Kiang
University of Sydney, Sydney, Australia
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Liyong Tong
Liyong Tong
University of Sydney, Sydney, Australia
Search for other works by this author on:
Jademond Kiang
University of Sydney, Sydney, Australia
Liyong Tong
University of Sydney, Sydney, Australia
Paper No:
SMASIS2016-9133, V001T02A006; 10 pages
Published Online:
November 29, 2016
Citation
Kiang, J, & Tong, L. "Characterization of Ni-Mn-Ga Shape Memory Single Crystals for Magnetic Properties and Magnetic Field Induced Shear and Normal Strains." Proceedings of the ASME 2016 Conference on Smart Materials, Adaptive Structures and Intelligent Systems. Volume 1: Multifunctional Materials; Mechanics and Behavior of Active Materials; Integrated System Design and Implementation; Structural Health Monitoring. Stowe, Vermont, USA. September 28–30, 2016. V001T02A006. ASME. https://doi.org/10.1115/SMASIS2016-9133
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