This work presents a fabrication process for the conformal growth of vertically aligned BaTiO3 films on 3-dimensionally patterned silicon waters. The conformal growth is performed through a two-step hydrothermal reaction that enables the direct growth of piezoelectric films on nonplanar architectures while utilizing relatively low synthesis temperatures. Scanning electron microscopy (SEM) is used to show the controllable conversion of TiO2 nanowires to BaTiO3 films and x-ray diffraction (XRD) is used to validate the crystal structures. Tested by a refined piezoresponse force microscopy (PFM) method, the conformal films exhibited a piezoelectric coupling coefficient as high as 100 pm/V. With superior piezoelectric properties and the capability to grow on design specific surfaces, the BaTiO3 conformal films demonstrate high potential for sensors, random access memory, and other micro-electromechanical systems.
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ASME 2016 Conference on Smart Materials, Adaptive Structures and Intelligent Systems
September 28–30, 2016
Stowe, Vermont, USA
Conference Sponsors:
- Aerospace Division
ISBN:
978-0-7918-5048-0
PROCEEDINGS PAPER
Conformal Growth of Textured Barium Titanate Films on Patterned Silicon Wafer
Brendan A. Patterson,
Brendan A. Patterson
University of Florida, Gainesville, FL
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Christopher C. Bowland,
Christopher C. Bowland
University of Florida, Gainesville, FL
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Mohammad H. Malakooti,
Mohammad H. Malakooti
University of Michigan, Ann Arbor, MI
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Henry A. Sodano
Henry A. Sodano
University of Michigan, Ann Arbor, MI
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Zhi Zhou
University of Florida, Gainesville, FL
Brendan A. Patterson
University of Florida, Gainesville, FL
Christopher C. Bowland
University of Florida, Gainesville, FL
Mohammad H. Malakooti
University of Michigan, Ann Arbor, MI
Henry A. Sodano
University of Michigan, Ann Arbor, MI
Paper No:
SMASIS2016-9073, V001T01A002; 5 pages
Published Online:
November 29, 2016
Citation
Zhou, Z, Patterson, BA, Bowland, CC, Malakooti, MH, & Sodano, HA. "Conformal Growth of Textured Barium Titanate Films on Patterned Silicon Wafer." Proceedings of the ASME 2016 Conference on Smart Materials, Adaptive Structures and Intelligent Systems. Volume 1: Multifunctional Materials; Mechanics and Behavior of Active Materials; Integrated System Design and Implementation; Structural Health Monitoring. Stowe, Vermont, USA. September 28–30, 2016. V001T01A002. ASME. https://doi.org/10.1115/SMASIS2016-9073
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