Studying and analyzing the ageing mechanisms of electronic components avionics in systems such as the GPS and INAV are of critical importance. In DC-DC power converter systems electrolytic capacitors and MOSFET’s have higher failure rates among the components. Degradation in the capacitors under varying operating conditions leads to high ripples output voltages and currents affecting downstream components leading to cascading faults. For example, in avionics systems where the power supply drives a GPS unit, ripple currents can cause glitches in the GPS position and velocity output, and this may cause errors in the Inertial Navigation (INAV) system, causing the aircraft to fly off course The work in this paper proposes a detail experimental and systematic study on analyzing the degradation phenomenon is electrolytic capacitors under high stress operating conditions. The output degradation is typically measured by an increase in ESR (Equivalent Series Resistance) and decrease in the capacitance value. We present the details of our accelerated ageing methodology along with analysis and comparison of the results.
Skip Nav Destination
ASME 2010 Conference on Smart Materials, Adaptive Structures and Intelligent Systems
September 28–October 1, 2010
Philadelphia, Pennsylvania, USA
Conference Sponsors:
- Aerospace Division
ISBN:
978-0-7918-4416-8
PROCEEDINGS PAPER
Diagnostic/Prognostic Experiments for Capacitor Degradation and Health Monitoring in DC-DC Converters
Chetan S. Kulkarni,
Chetan S. Kulkarni
Vanderbilt University, Nashville, TN
Search for other works by this author on:
Gautam Biswas,
Gautam Biswas
Vanderbilt University, Nashville, TN
Search for other works by this author on:
Xenofon Koutsoukos,
Xenofon Koutsoukos
Vanderbilt University, Nashville, TN
Search for other works by this author on:
Jose Celaya,
Jose Celaya
NASA Ames Research Center, Moffett Field, CA
Search for other works by this author on:
Kai Goebel
Kai Goebel
NASA Ames Research Center, Moffett Field, CA
Search for other works by this author on:
Chetan S. Kulkarni
Vanderbilt University, Nashville, TN
Gautam Biswas
Vanderbilt University, Nashville, TN
Xenofon Koutsoukos
Vanderbilt University, Nashville, TN
Jose Celaya
NASA Ames Research Center, Moffett Field, CA
Kai Goebel
NASA Ames Research Center, Moffett Field, CA
Paper No:
SMASIS2010-3862, pp. 775-781; 7 pages
Published Online:
April 4, 2011
Citation
Kulkarni, CS, Biswas, G, Koutsoukos, X, Celaya, J, & Goebel, K. "Diagnostic/Prognostic Experiments for Capacitor Degradation and Health Monitoring in DC-DC Converters." Proceedings of the ASME 2010 Conference on Smart Materials, Adaptive Structures and Intelligent Systems. ASME 2010 Conference on Smart Materials, Adaptive Structures and Intelligent Systems, Volume 2. Philadelphia, Pennsylvania, USA. September 28–October 1, 2010. pp. 775-781. ASME. https://doi.org/10.1115/SMASIS2010-3862
Download citation file:
11
Views
Related Proceedings Papers
Related Articles
Epoxy Nanocomposite Capacitors for Application as MCM-L Compatible Integral Passives
J. Electron. Packag (March,2002)
Accelerated Temperature and Voltage Stress Tests of Embedded Planar Capacitors With Epoxy–BaTiO 3 Composite Dielectric
J. Electron. Packag (June,2012)
On-Wafer Capacitors Under Mechanical Stress
J. Electron. Packag (September,2007)
Related Chapters
Spice Model on High Frequency Vibration for CMUT Application
International Conference on Mechanical and Electrical Technology, 3rd, (ICMET-China 2011), Volumes 1–3
New Faulty Line Selection Technology Cooperated with Style and Control of Petersen Coils
International Conference on Instrumentation, Measurement, Circuits and Systems (ICIMCS 2011)
Cooling a Radar’s Electronic Board
Electromagnetic Waves and Heat Transfer: Sensitivites to Governing Variables in Everyday Life