An approach to detect anomalies in IGBTs is to monitor the collector-emitter current and voltage in application. These current and voltage parameters can then be reduced to a univariate distance measure called the Mahalanobis Distance (MD). The MD values with the use of an appropriate threshold enable anomaly detection of these devices. Mahalanobis distances (MD) are weighted Euclidean distances; the distance of each point from the center of the distribution is weighted by the inverse of the sample variance-covariance matrix. The presence of outliers in the monitored data can lead to the overestimation of the covariance matrix that in turn affects the anomaly detection results. This issue can be addressed by the use of robust covariance estimation techniques. In this study, the minimum volume ellipsoid (MVE) estimator, the minimum covariance determinant estimator (MCD) and the nearest neighbor variance estimator (NNVE) were used for anomaly detection of IGBTs. IGBTs were aged under a resistive load until failure. The monitored collector-emitter current and voltage values were used as input parameters for the MD calculation. The three robust covariance estimation techniques were used to compute the MD values and the anomaly detection times were compared to the results obtained by the classical covariance estimation technique.
Skip Nav Destination
ASME 2010 Conference on Smart Materials, Adaptive Structures and Intelligent Systems
September 28–October 1, 2010
Philadelphia, Pennsylvania, USA
Conference Sponsors:
- Aerospace Division
ISBN:
978-0-7918-4416-8
PROCEEDINGS PAPER
Evaluation of Robust Covariance Estimation Techniques for Anomaly Detection of Insulated Gate Bipolar Transistors (IGBT)
Nishad Patil,
Nishad Patil
University of Maryland, College Park, MD
Search for other works by this author on:
Sandeep Menon,
Sandeep Menon
University of Maryland, College Park, MD
Search for other works by this author on:
Diganta Das,
Diganta Das
University of Maryland, College Park, MD
Search for other works by this author on:
Michael Pecht
Michael Pecht
University of Maryland; City University of Hong Kong, College Park, MD
Search for other works by this author on:
Nishad Patil
University of Maryland, College Park, MD
Sandeep Menon
University of Maryland, College Park, MD
Diganta Das
University of Maryland, College Park, MD
Michael Pecht
University of Maryland; City University of Hong Kong, College Park, MD
Paper No:
SMASIS2010-3861, pp. 769-773; 5 pages
Published Online:
April 4, 2011
Citation
Patil, N, Menon, S, Das, D, & Pecht, M. "Evaluation of Robust Covariance Estimation Techniques for Anomaly Detection of Insulated Gate Bipolar Transistors (IGBT)." Proceedings of the ASME 2010 Conference on Smart Materials, Adaptive Structures and Intelligent Systems. ASME 2010 Conference on Smart Materials, Adaptive Structures and Intelligent Systems, Volume 2. Philadelphia, Pennsylvania, USA. September 28–October 1, 2010. pp. 769-773. ASME. https://doi.org/10.1115/SMASIS2010-3861
Download citation file:
13
Views
Related Proceedings Papers
Advanced Cooling Designs for GaN-on-Diamond MMICs
InterPACK2015
Wire Bond Failures in Power Modules
IMECE2003
Related Articles
Heat Transfer of an IGBT Module Integrated With a Vapor Chamber
J. Electron. Packag (March,2011)
Thermal Phenomena in Nanoscale Transistors
J. Electron. Packag (June,2006)
Device for Quantifying Neural Response and Other Conditions by Measuring Sweat Gland Function
J. Med. Devices (September,2014)
Related Chapters
Spice Model on High Frequency Vibration for CMUT Application
International Conference on Mechanical and Electrical Technology, 3rd, (ICMET-China 2011), Volumes 1–3
Low Power and Low Area Analog Multiplier Using MiFGMOS
International Conference on Computer and Automation Engineering, 4th (ICCAE 2012)
Development and Structure of the German Common Cause Failure Data Pool (PSAM-0020)
Proceedings of the Eighth International Conference on Probabilistic Safety Assessment & Management (PSAM)