A commercially available soft lead titanate zirconate (PZT) wafer that is poled in thickness direction is subjected to various constant magnitudes of longitudinal tensile stress. The evolutions of longitudinal and transverse in-plane strains over time are measured in short- and open-circuit boundary conditions. The measurements are explained qualitatively in terms of domain switching and predicted quantitatively by a free energy model of normal distribution.
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Time-Dependent Strain Responses of a Poled PZT Wafer Under Various Constant Magnitudes of Longitudinal Tensile Stress
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Kim, S, & Lee, C. "Time-Dependent Strain Responses of a Poled PZT Wafer Under Various Constant Magnitudes of Longitudinal Tensile Stress." Proceedings of the ASME 2009 Conference on Smart Materials, Adaptive Structures and Intelligent Systems. Volume 1: Active Materials, Mechanics and Behavior; Modeling, Simulation and Control. Oxnard, California, USA. September 21–23, 2009. pp. 229-239. ASME. https://doi.org/10.1115/SMASIS2009-1389
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