This paper discusses the temperature effects of using piezoelectric wafer active sensors (PWAS) technologies for structural health monitoring (SHM) in pressure vessels and piping (PVP) applications, e.g. dry cast storage system (DCSS). The research into monitoring of DCSS health has experienced a dramatic increase following the issuance of the Blue Ribbon Commission (BRC) on America’s Nuclear Future Final Report in 2012. The interim storage of spent nuclear fuel from reactor sites has gained additional importance and urgency for resolving waste-management-related technical issues. PWAS have emerged as one of the major SHM technologies developed particularly for generating and receiving acousto-ultrasonic waves for the purpose of continuous monitoring and diagnosis. Durability and survivability of PWAS under temperature effects was first tested in experiments. The analytical model of PWAS based sensor and sensing system under temperature effects was then developed. This paper compared the analytical model and experimental results of PWAS under temperature changes. Since the environmental variability of a sensing system includes changes in both the sensors and the sensing methodology including acoustic emission (AE), guided ultrasonic waves (GUW), and electro-mechanical impedance spectroscopy (EMIS), we also performed several temperature exposure with different PWAS sensing configurations under a controlled oven. The potential of PWAS for DCSS applications has been explored. The paper ends with conclusions and suggestions for further work.
Skip Nav Destination
ASME 2015 Pressure Vessels and Piping Conference
July 19–23, 2015
Boston, Massachusetts, USA
Conference Sponsors:
- Pressure Vessels and Piping Division
ISBN:
978-0-7918-5699-4
PROCEEDINGS PAPER
Temperature Effects on Piezoelectric Wafer Active Sensors
Linlin Ma,
Linlin Ma
University of South Carolina, Columbia, SC
Search for other works by this author on:
Xiaoyi Sun,
Xiaoyi Sun
University of South Carolina, Columbia, SC
Search for other works by this author on:
Bin Lin,
Bin Lin
University of South Carolina, Columbia, SC
Search for other works by this author on:
Lingyu Yu
Lingyu Yu
University of South Carolina, Columbia, SC
Search for other works by this author on:
Linlin Ma
University of South Carolina, Columbia, SC
Xiaoyi Sun
University of South Carolina, Columbia, SC
Bin Lin
University of South Carolina, Columbia, SC
Lingyu Yu
University of South Carolina, Columbia, SC
Paper No:
PVP2015-45841, V06AT06A007; 8 pages
Published Online:
November 19, 2015
Citation
Ma, L, Sun, X, Lin, B, & Yu, L. "Temperature Effects on Piezoelectric Wafer Active Sensors." Proceedings of the ASME 2015 Pressure Vessels and Piping Conference. Volume 6A: Materials and Fabrication. Boston, Massachusetts, USA. July 19–23, 2015. V06AT06A007. ASME. https://doi.org/10.1115/PVP2015-45841
Download citation file:
9
Views
Related Proceedings Papers
Related Articles
Durability Test Results of a Polymer Electrolyte Membrane Fuel Cell Operated at Overnominal Temperature With Low Humidified Reactants
J. Fuel Cell Sci. Technol (April,2010)
Nondestructive Evaluation of FRP Design Criteria With Primary Consideration to Fatigue Loading
J. Pressure Vessel Technol (May,2004)
Influence of Elevated Temperature on the Acoustic Emission Evaluation of FRP Vessels Through Internal Fluid Pressure Tests
J. Pressure Vessel Technol (October,2009)
Related Chapters
Development of Nuclear Boiler and Pressure Vessels in Taiwan
Companion Guide to the ASME Boiler and Pressure Vessel Code, Volume 3, Third Edition
Subsection NCA—General Requirements for Division 1 and Division 2
Companion Guide to the ASME Boiler & Pressure Vessel Code, Volume 1, Second Edition
Subsection NCA—General Requirements for Division 1 and Division 2
Companion Guide to the ASME Boiler and Pressure Vessel Code, Volume 1, Third Edition