The accurate prediction of extreme wave heights and crests is important to the design of offshore structures. For example, knowledge of the extreme crest elevation is required to set the deck elevation of the topside of a jacket structure. However, methods of extreme value analysis have an inherent bias, and the manner in which they are applied affects this bias. Furthermore, there is uncertainty in the design parameters at the time of design and the possibility that the predictions will change during the life of the structure. This paper is concerned with the accurate prediction of design values that incorporate uncertainty. In the first part of this paper the details of commonly applied extreme value analysis techniques are examined. This is achieved through analysis of simulated data of known distribution. In particular it is the application of least squares minimisation routines that is investigated; however, comparisons are made with maximum likelihood estimation. From this, preferred approaches to the analysis are recommended and their advantages and disadvantages discussed. The methods are applied to the analysis of a North Sea data set and the implications for the design values ascertained. In the second part of the paper Bayesian inference is used to consider the effect of uncertainty in the predicted wave heights and crest elevations. The practical implications are determined by the analysis of a measured North Sea data set.
Skip Nav Destination
ASME 2009 28th International Conference on Ocean, Offshore and Arctic Engineering
May 31–June 5, 2009
Honolulu, Hawaii, USA
Conference Sponsors:
- Ocean, Offshore and Arctic Engineering Division
ISBN:
978-0-7918-4342-0
PROCEEDINGS PAPER
Bias and Uncertainty in the Estimation of Extreme Wave Heights and Crests
Richard Gibson,
Richard Gibson
BP Exploration, Verdal, Norway
Search for other works by this author on:
Colin Grant,
Colin Grant
BP Exploration, Sunbury on Thames, UK
Search for other works by this author on:
George Z. Forristall,
George Z. Forristall
Forristall Ocean Engineering, Inc., Camden, ME
Search for other works by this author on:
Peter Owrid,
Peter Owrid
PhysE Ltd., Yarmouth, Isle of Wight, UK
Search for other works by this author on:
Ian Leggett
Ian Leggett
Shell Exploration and Production Europe, Aberdeen, UK
Search for other works by this author on:
Richard Gibson
BP Exploration, Verdal, Norway
Colin Grant
BP Exploration, Sunbury on Thames, UK
George Z. Forristall
Forristall Ocean Engineering, Inc., Camden, ME
Rory Smyth
OceanMetriX Ltd., Dover, Kent, UK
Peter Owrid
PhysE Ltd., Yarmouth, Isle of Wight, UK
Oistein Hagen
DNV Energy, Oslo, Norway
Ian Leggett
Shell Exploration and Production Europe, Aberdeen, UK
Paper No:
OMAE2009-79466, pp. 363-373; 11 pages
Published Online:
February 16, 2010
Citation
Gibson, R, Grant, C, Forristall, GZ, Smyth, R, Owrid, P, Hagen, O, & Leggett, I. "Bias and Uncertainty in the Estimation of Extreme Wave Heights and Crests." Proceedings of the ASME 2009 28th International Conference on Ocean, Offshore and Arctic Engineering. Volume 2: Structures, Safety and Reliability. Honolulu, Hawaii, USA. May 31–June 5, 2009. pp. 363-373. ASME. https://doi.org/10.1115/OMAE2009-79466
Download citation file:
7
Views
0
Citations
Related Proceedings Papers
Related Articles
Alternative Environmental Contours for Marine Structural Design—A Comparison Study
J. Offshore Mech. Arct. Eng (October,2015)
Stochastic Storm Profiles for Strain Accumulation in Clay
J. Offshore Mech. Arct. Eng (February,1994)
Non-Gaussian Extreme Waves in the Central North Sea
J. Offshore Mech. Arct. Eng (August,1997)
Related Chapters
Presenting a Channel Estimation Method with Considering the Carrier Frequency Offset Based on Comparative Methods in MIMO-OFDM Systems
International Conference on Computer Technology and Development, 3rd (ICCTD 2011)
A Method of Carrier Synchronization Based on Exit for LDPC Encoded Systems
International Conference on Instrumentation, Measurement, Circuits and Systems (ICIMCS 2011)
Introductory Information
The Stress Analysis of Cracks Handbook, Third Edition