This paper presents a methodology to obtain the day-night average sound pressure levels DNL from continuous measurements. The methodology is used for processing data acquired during 3 days of the summer of 2011 at a point located 9,500 meters to the south of the SCEL airport in Santiago of Chile, considering the unique contribution of aircraft noise. Additionally, this measured DNL is compared with a modeling performed for the same point via the software Integrated Noise Model version 7.0b. Finally, using the model settled, a calculation was made to find values of DNL on the same points where measurements were made in 2003 under the Environmental Impact Assessment for the second runway of the SCEL Airport. The results were compared and discussed.
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ASME 2012 Noise Control and Acoustics Division Conference at InterNoise 2012
August 19–22, 2012
New York City, New York, USA
Conference Sponsors:
- Noise Control and Acoustics Division
ISBN:
978-0-7918-4532-5
PROCEEDINGS PAPER
Comparison of Measured and Modeled DNL Values in the Vicinity of the SCEL Airport, Santiago, Chile Available to Purchase
Max Glisser,
Max Glisser
Control Acústico, Ñuñoa, Santiago, Chile
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Alejandro Osses,
Alejandro Osses
Sociedad Acustical S.A., Ñuñoa, Santiago, Chile
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Claudio Albornoz,
Claudio Albornoz
Control Acústico, Ñuñoa, Santiago, Chile
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Christian Gerard
Christian Gerard
Control Acústico, Ñuñoa, Santiago, Chile
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Max Glisser
Control Acústico, Ñuñoa, Santiago, Chile
Alejandro Osses
Sociedad Acustical S.A., Ñuñoa, Santiago, Chile
Claudio Albornoz
Control Acústico, Ñuñoa, Santiago, Chile
Christian Gerard
Control Acústico, Ñuñoa, Santiago, Chile
Paper No:
NCAD2012-1108, pp. 405-412; 8 pages
Published Online:
September 10, 2013
Citation
Glisser, M, Osses, A, Albornoz, C, & Gerard, C. "Comparison of Measured and Modeled DNL Values in the Vicinity of the SCEL Airport, Santiago, Chile." Proceedings of the ASME 2012 Noise Control and Acoustics Division Conference at InterNoise 2012. ASME 2012 Noise Control and Acoustics Division Conference. New York City, New York, USA. August 19–22, 2012. pp. 405-412. ASME. https://doi.org/10.1115/NCAD2012-1108
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