In this paper, we introduce a novel methodology to determine the size and structure of nano-particles on a surface. We present an analysis, dubbed Elliptically Polarized Surface-Wave Scattering (EPSWS) approach, to show that 5–10 nm size particles on or above an interface can be characterized by using the scattered surface plasmon (SP) or evanescent waves. We present an analysis to show that the scattering matrix elements of the evanescent waves scattered by the nano-particles on or near an interface can be used for characterization of nano-size particles.
Surface-Wave-Scattering-Based Characterization of Nano-Particles
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Aslan, MM, & Mengu¨c¸, MP. "Surface-Wave-Scattering-Based Characterization of Nano-Particles." Proceedings of the ASME 2004 3rd Integrated Nanosystems Conference. Design, Synthesis, and Applications. Pasadena, California, USA. September 22–24, 2004. pp. 135-137. ASME. https://doi.org/10.1115/NANO2004-46062
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