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Proceedings Papers

Fractal Pattern Recognition of Image Profiles for Manufacturing Process Monitoring and Control

Farhad Imani, Bing Yao, Ruimin Chen, Prahalada Rao, Hui Yang
Proc. ASME. MSEC2018, Volume 3: Manufacturing Equipment and Systems, V003T02A003, June 18–22, 2018
Paper No: MSEC2018-6523
DOI: https://doi.org/10.1115/MSEC2018-6523
View Paper titled, Fractal Pattern Recognition of Image Profiles for Manufacturing Process Monitoring and Control
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Topics: Fractals, Manufacturing, Pattern recognition, Additive manufacturing, Machining, Biomanufacturing, Dynamics (Mechanics), Finishes, Imaging, Manufacturing industry
Proceedings Papers

Approaches to Implement Statistical Process Control for Manufacturing in Big Data Era

Shing I. Chang
Proc. ASME. MSEC2017, Volume 3: Manufacturing Equipment and Systems, V003T04A009, June 4–8, 2017
Paper No: MSEC2017-2840
DOI: https://doi.org/10.1115/MSEC2017-2840
View Paper titled, Approaches to Implement Statistical Process Control for Manufacturing in Big Data Era
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Topics: Manufacturing, Statistical process control, Cloud computing, Quality control charts, Water
Proceedings Papers

Monitoring Multistage Surface Spatial Variations Using Functional Morphing

Saumuy Suriano, Hui Wang, S. Jack Hu
Proc. ASME. MSEC2013, Volume 2: Systems; Micro and Nano Technologies; Sustainable Manufacturing, V002T02A033, June 10–14, 2013
Paper No: MSEC2013-1203
DOI: https://doi.org/10.1115/MSEC2013-1203
View Paper titled, Monitoring Multistage Surface Spatial Variations Using Functional Morphing
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Topics: Algorithms, Linkages, Machining, Manufacturing, Process monitoring, Resolution (Optics), Shapes, Statistical process control
Proceedings Papers

Statistical Process Monitoring With MTConnect

Sri Atluru, Amit Deshpande
Proc. ASME. MSEC2012, ASME 2012 International Manufacturing Science and Engineering Conference, 791-798, June 4–8, 2012
Paper No: MSEC2012-7344
DOI: https://doi.org/10.1115/MSEC2012-7344
View Paper titled, Statistical Process Monitoring With MTConnect
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Topics: Process monitoring, Statistical process control, Machinery, Statistical analysis, Graphical user interfaces, Manufacturing, Probes, Aerospace industry, Computer numerical control machine tools, Computers
Proceedings Papers

Standardization of CMM Fitting Algorithms and Development of Inspection Maps for Use in Statistical Process Control

Neelakantan Mani, Jami J. Shah, Joseph K. Davidson
Proc. ASME. MSEC2011, ASME 2011 International Manufacturing Science and Engineering Conference, Volume 2, 33-47, June 13–17, 2011
Paper No: MSEC2011-50152
DOI: https://doi.org/10.1115/MSEC2011-50152
View Paper titled, Standardization of CMM Fitting Algorithms and Development of Inspection Maps for Use in Statistical Process Control
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Topics: Algorithms, Coordinate measuring machines, Fittings, Inspection, Statistical process control, Computer software, Errors, Hull, Manufacturing, Mathematics
Proceedings Papers

Comparison of Process Capability Index and SPC Control Limits Calculations When Using Different Inspection Tools

Mohamed A. Gadalla, Miroslaw Popielarczyk
Proc. ASME. MSEC2011, ASME 2011 International Manufacturing Science and Engineering Conference, Volume 2, 15-22, June 13–17, 2011
Paper No: MSEC2011-50007
DOI: https://doi.org/10.1115/MSEC2011-50007
View Paper titled, Comparison of Process Capability Index and SPC Control Limits Calculations When Using Different Inspection Tools
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Topics: Inspection, Statistical process control, Coordinate measuring machines, Manufacturing, Gages, Metrology, Product engineering
Proceedings Papers

Adaptive Anomaly Detection Using a Hidden Markov Model

Seungchul Lee, Lin Li, Jun Ni
Proc. ASME. MSEC2010, ASME 2010 International Manufacturing Science and Engineering Conference, Volume 2, 599-606, October 12–15, 2010
Paper No: MSEC2010-34169
DOI: https://doi.org/10.1115/MSEC2010-34169
View Paper titled, Adaptive Anomaly Detection Using a Hidden Markov Model
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Topics: Condition monitoring, Failure mechanisms, Fault diagnosis, Manufacturing industry, Statistical process control, Wear
Proceedings Papers

Assessment of Tool Wear Based on Surface Texture Parameters

Yi Liao, David A. Stephenson, Jun Ni
Proc. ASME. MSEC2009, ASME 2009 International Manufacturing Science and Engineering Conference, Volume 2, 463-470, October 4–7, 2009
Paper No: MSEC2009-84153
DOI: https://doi.org/10.1115/MSEC2009-84153
View Paper titled, Assessment of Tool Wear Based on Surface Texture Parameters
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Topics: Surface texture, Wear, Statistical process control, Cutting, Cutting tools, Interferometers, Lasers
Proceedings Papers

Applying BPN and EWMA SPC Chart to Cold Chain Temperature Monitoring

Kai-Ying Chen, Yi-Cheng Shaw, Mu-Chen Chen, Teh-Chang Wu
Proc. ASME. MSEC2009, ASME 2009 International Manufacturing Science and Engineering Conference, Volume 1, 247-256, October 4–7, 2009
Paper No: MSEC2009-84209
DOI: https://doi.org/10.1115/MSEC2009-84209
View Paper titled, Applying BPN and EWMA SPC Chart to Cold Chain Temperature Monitoring
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Topics: Chain, Statistical process control, Temperature
Proceedings Papers

Monitoring and Diagnosis of Assembly Fixture Faults Using Modified Multivariate Control Charts and Surface Scanning Content

Jeremy Rickli, Jaime Camelio
Proc. ASME. MSEC2007, ASME 2007 International Manufacturing Science and Engineering Conference, 555-563, October 15–18, 2007
Paper No: MSEC2007-31075
DOI: https://doi.org/10.1115/MSEC2007-31075
View Paper titled, Monitoring and Diagnosis of Assembly Fixture Faults Using Modified Multivariate Control Charts and Surface Scanning Content
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Topics: Manufacturing, Quality control charts, Fault diagnosis, Process monitoring, Sheet metal, Statistical process control
Proceedings Papers

Assembly Faults Diagnosis Using Neural Networks and Process Knowledge

Qiangsheng Zhao, Jaime Camelio
Proc. ASME. MSEC2007, ASME 2007 International Manufacturing Science and Engineering Conference, 565-572, October 15–18, 2007
Paper No: MSEC2007-31095
DOI: https://doi.org/10.1115/MSEC2007-31095
View Paper titled, Assembly Faults Diagnosis Using Neural Networks and Process Knowledge
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Topics: Artificial neural networks, Manufacturing, Statistical process control, Fault diagnosis, Modeling, Automobiles, Doors, Feedforward control, Flaw detection, Quality control charts