Maskless nanolithography is an agile and cost effective approach if their throughputs can be scaled for mass production purposes. Using plasmonic nanolithography approach, direct pattern writing was successfully demonstrated with 22 nm half-pitch at high speed. Plasmonic nanolithography uses an array of plasmonic lenses to directly pattern features on a rotating substrate. Taking the advantage of air bearing surface techniques, the system can expose the wafer pixel by pixel with a speed of ∼10 m/s, much faster than any conventional scanning based lithography system. It is a low-cost, high-throughput maskless approach for the next generation lithography and also for the emerging nanotechnology applications, such as nanoscale metrology and imaging. A critical part of the PNL is to use plasmonic lens to deliver highly concentrated optical power at nanoscale. We have demonstrated such nanoscale process and achieved 22 nm resolution. Here, we report our recent efforts of designing new plasmonic nanofocusing structures that is capable of achieving optical confinement below 20 nm which can potentially support direct patterning at sub-10nm resolution.
Skip Nav Destination
ASME 2017 12th International Manufacturing Science and Engineering Conference collocated with the JSME/ASME 2017 6th International Conference on Materials and Processing
June 4–8, 2017
Los Angeles, California, USA
Conference Sponsors:
- Manufacturing Engineering Division
ISBN:
978-0-7918-5074-9
PROCEEDINGS PAPER
Plasmonic Nanofocusing in Deep and Extreme Sub-Wavelength Scale for Scalable Nanolithography
Zhidong Du,
Zhidong Du
Purdue University, West Lafayette, IN
Search for other works by this author on:
Chen Chen,
Chen Chen
Purdue University, West Lafayette, IN
Search for other works by this author on:
Liang Pan
Liang Pan
Purdue University, West Lafayette, IN
Search for other works by this author on:
Zhidong Du
Purdue University, West Lafayette, IN
Chen Chen
Purdue University, West Lafayette, IN
Liang Pan
Purdue University, West Lafayette, IN
Paper No:
MSEC2017-2680, V003T04A072; 6 pages
Published Online:
July 24, 2017
Citation
Du, Z, Chen, C, & Pan, L. "Plasmonic Nanofocusing in Deep and Extreme Sub-Wavelength Scale for Scalable Nanolithography." Proceedings of the ASME 2017 12th International Manufacturing Science and Engineering Conference collocated with the JSME/ASME 2017 6th International Conference on Materials and Processing. Volume 3: Manufacturing Equipment and Systems. Los Angeles, California, USA. June 4–8, 2017. V003T04A072. ASME. https://doi.org/10.1115/MSEC2017-2680
Download citation file:
19
Views
Related Proceedings Papers
Related Articles
Study on Microgratings Using Imaging, Spectroscopic, and Fourier Lens Scatterometry
J. Micro Nano-Manuf (September,2017)
A Bid to Take The Lead
Mechanical Engineering (January,2002)
Guest Editorial
J. Manuf. Sci. Eng (June,2010)
Related Chapters
Introduction
Bacteriophage T4 Tail Fibers as a Basis for Structured Assemblies
Regulatory perspectives
Biocompatible Nanomaterials for Targeted and Controlled Delivery of Biomacromolecules
Surface Analysis and Tools
Tribology of Mechanical Systems: A Guide to Present and Future Technologies