Burrs on the patterned metal mask could degrade the quality of pixels on the semiconductor devices during a vacuum deposition process. In this study, deburring process on the patterned metal mask was performed using abrasive deburring, pulsed electron beam irradiation, and hybrid deburring process combining abrasive deburring and electron beam irradiation. The most widely used material for the metal mask, AISI 304 stainless steel, was patterned by fiber-laser cutting. The performance of each deburring method was evaluated measuring sizes of burrs remained after processing. Surface textures were also observed by white-interferometer. Electrochemical analysis on the bare, fiber-laser cut, and LEPB-treated surface was performed to evaluate a corrosion resistance. Based on the potentiodynamic polarization test, corrosion rate and polarization resistance on the surface was calculated using Tafel extrapolation.
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ASME 2015 International Manufacturing Science and Engineering Conference
June 8–12, 2015
Charlotte, North Carolina, USA
Conference Sponsors:
- Manufacturing Engineering Division
ISBN:
978-0-7918-5682-6
PROCEEDINGS PAPER
The Large Pulsed Electron Beam (LPEB)-Assisted Hybrid Deburring Process of the Patterned Metal Masks Available to Purchase
Jisoo Kim,
Jisoo Kim
Ulsan National Institute of Science and Technology, Ulsan, Korea
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Hyung Wook Park
Hyung Wook Park
Ulsan National Institute of Science and Technology, Ulsan, Korea
Search for other works by this author on:
Jisoo Kim
Ulsan National Institute of Science and Technology, Ulsan, Korea
Hyung Wook Park
Ulsan National Institute of Science and Technology, Ulsan, Korea
Paper No:
MSEC2015-9233, V001T02A041; 8 pages
Published Online:
September 25, 2015
Citation
Kim, J, & Park, HW. "The Large Pulsed Electron Beam (LPEB)-Assisted Hybrid Deburring Process of the Patterned Metal Masks." Proceedings of the ASME 2015 International Manufacturing Science and Engineering Conference. Volume 1: Processing. Charlotte, North Carolina, USA. June 8–12, 2015. V001T02A041. ASME. https://doi.org/10.1115/MSEC2015-9233
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