Coating failures due to delaminations are the primary life-limiting criteria of diamond-coated tools in machining. Process monitoring to capture coating failures is thus desired to prevent from poor part quality and possible production disruption. Following previous studies of AE signal analysis for diamond coating failure monitoring in machining applications, this research applied a short-time Fourier transformation (STFT) method to capture the coating failure transition during cutting. The method uses sub-divided signal segments, in a continuous manner, for the fast Fourier transform (FFT) analysis and computes the amplitude ratio of high vs. low frequencies as a function of cutting time during a cutting pass. The results show that during the coating failure pass, a clear sharp increase of amplitude ratio (value change over one) of high/low frequency occurs along the cutting time. On the other hand, the amplitude ratio only exhibits a certain low range fluctuations in other passes, e.g., initial cutting and prior to failure passes. Thus, it can be suggested that the applied STFT method has a potential for diamond coating failure monitoring. However, for coating failure associated with a smaller tool wear (less than 0.8 mm flank wear-land width), the amplitude ratio plot from the STFT analysis may not clearly show the failure transition.
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ASME 2010 International Manufacturing Science and Engineering Conference
October 12–15, 2010
Erie, Pennsylvania, USA
Conference Sponsors:
- Manufacturing Engineering Division
ISBN:
978-0-7918-4946-0
PROCEEDINGS PAPER
Short-Time Fourier Transform Method in AE Signal Analysis for Diamond Coating Failure Monitoring in Machining Applications
Ping Lu,
Ping Lu
The University of Alabama, Tuscaloosa, AL
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Y. Kevin Chou,
Y. Kevin Chou
The University of Alabama, Tuscaloosa, AL
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Raymond G. Thompson
Raymond G. Thompson
Vista Engineering, Inc., Birmingham, AL
Search for other works by this author on:
Ping Lu
The University of Alabama, Tuscaloosa, AL
Y. Kevin Chou
The University of Alabama, Tuscaloosa, AL
Raymond G. Thompson
Vista Engineering, Inc., Birmingham, AL
Paper No:
MSEC2010-34305, pp. 453-460; 8 pages
Published Online:
April 11, 2011
Citation
Lu, P, Chou, YK, & Thompson, RG. "Short-Time Fourier Transform Method in AE Signal Analysis for Diamond Coating Failure Monitoring in Machining Applications." Proceedings of the ASME 2010 International Manufacturing Science and Engineering Conference. ASME 2010 International Manufacturing Science and Engineering Conference, Volume 1. Erie, Pennsylvania, USA. October 12–15, 2010. pp. 453-460. ASME. https://doi.org/10.1115/MSEC2010-34305
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