Mesoporous and dense titanium dioxide (TiO2) and silicon dioxide (SiO2) films were deposited directly from nanoparticle colloidal suspensions on quartz using a liquid phase deposition technique. The quartz surface was pre-treated with an -OH group to activate the deposition surface for crack-free adhesion. The deposited films were characterized with the help of scanning electron microscope for microstructural evaluation. An optical profilometer was used to measure the optical properties of the SiO2 film. The reflectance and transmittance patterns of the film were analyzed to determine the index of refraction of the film.

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