This work is a statistical study of the broadband light absorption in thin film solar cells, enhanced by metallic surface nanotexturing. We consider optimum grating structures on the surface of amorphous silicon solar cells obtained by inverse optimization techniques, and use Monte Carlo techniques to analyze the joint statistics of the resulting absorption enhancement/spectra in the presence of time and structural variants including fabrication error and year around changes in the solar irradiance, as well angle of incident. We adopt yearly data for solar irradiation for individual hours. In conjunction with the data for light absorption spectra at various incident angles and Monte Carlo sampling of the fabrication error vector, we evaluate the real world performance of optimized solar cells. The resulting conclusions serve as a sensitivity/time analysis for better understanding the limits of performance and robustness of thin film cells and optimal light trapping mechanisms.
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ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer
March 3–6, 2012
Atlanta, Georgia, USA
Conference Sponsors:
- Nanotechnology Institute
ISBN:
978-0-7918-5477-8
PROCEEDINGS PAPER
Statistical Analysis of Surface Nanopatterned Thin Film Solar Cells Obtained by Inverse Optimization
Shima Hajimirza,
Shima Hajimirza
The University of Texas at Austin, Austin, TX
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John R. Howell
John R. Howell
The University of Texas at Austin, Austin, TX
Search for other works by this author on:
Shima Hajimirza
The University of Texas at Austin, Austin, TX
John R. Howell
The University of Texas at Austin, Austin, TX
Paper No:
MNHMT2012-75066, pp. 569-577; 9 pages
Published Online:
July 18, 2013
Citation
Hajimirza, S, & Howell, JR. "Statistical Analysis of Surface Nanopatterned Thin Film Solar Cells Obtained by Inverse Optimization." Proceedings of the ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer. ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer. Atlanta, Georgia, USA. March 3–6, 2012. pp. 569-577. ASME. https://doi.org/10.1115/MNHMT2012-75066
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