As discovered by recent studies, the wetting and spreading is directly affected by the curvature in the micro-region rather than the macroscopic contact angle. Consequently, measuring the liquid profile in the micro-region becomes an important research topic. Recently, catastrophe optics has been applied to these measurements. Optical catastrophe occurring in far field of waves of liquid-refracted laser beam yields a wealth of information about the liquid spreading not only for liquid drops but also for films. When a parallel laser beam passes through a liquid film on a slide glass at the three-phase-line (TPL), very interesting optical image patterns occur on a screen far from the film. An analysis based on catastrophe optics discloses and interprets the formation of these optical image patterns. The analysis reveals that the caustic line manifested as the bright-thick line on the screen implies the lowest hierarchy of optical catastrophes, called fold caustic. This optical catastrophe is produced by the inflexion line on the liquid surface at the liquid foot, which is formed not only in the spreading of drops but also in spreading of films. The generalized catastrophe optics method enables the identification of the edge profiles and determine the edge foot height of liquid films.
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ASME 2009 Second International Conference on Micro/Nanoscale Heat and Mass Transfer
December 18–21, 2009
Shanghai, China
Conference Sponsors:
- Nanotechnology Institute
ISBN:
978-0-7918-4390-1
PROCEEDINGS PAPER
Catastrophe Optics Method to Determine the Micro-Nano Size Profiles at TPL of Liquid Films on a Solid Surface
David F. Chao,
David F. Chao
NASA Glenn Research Center, Cleveland, OH
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J. B. McQuillen,
J. B. McQuillen
NASA Glenn Research Center, Cleveland, OH
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J. M. Sankovic,
J. M. Sankovic
NASA Glenn Research Center, Cleveland, OH
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Nengli Zhang
Nengli Zhang
Ohio Aerospace Institute at NASA Glenn Research Center, Cleveland, OH
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David F. Chao
NASA Glenn Research Center, Cleveland, OH
J. B. McQuillen
NASA Glenn Research Center, Cleveland, OH
J. M. Sankovic
NASA Glenn Research Center, Cleveland, OH
Nengli Zhang
Ohio Aerospace Institute at NASA Glenn Research Center, Cleveland, OH
Paper No:
MNHMT2009-18335, pp. 443-449; 7 pages
Published Online:
October 26, 2010
Citation
Chao, DF, McQuillen, JB, Sankovic, JM, & Zhang, N. "Catastrophe Optics Method to Determine the Micro-Nano Size Profiles at TPL of Liquid Films on a Solid Surface." Proceedings of the ASME 2009 Second International Conference on Micro/Nanoscale Heat and Mass Transfer. ASME 2009 Second International Conference on Micro/Nanoscale Heat and Mass Transfer, Volume 2. Shanghai, China. December 18–21, 2009. pp. 443-449. ASME. https://doi.org/10.1115/MNHMT2009-18335
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