Based on the commercial software, CFD-ACE+, a three-dimensional discharge model of an inductively coupled plasma (ICP) etcher was built. The spatial distributions of the electron temperature and the electron number density (END) of the argon plasma were simulated at 10 mTorr, 200 W and 200 sccm. One-dimensional distribution profiles of the plasma parameters above the wafer’s surface at different pressures and powers were compared. These results demonstrate that the END increases with both pressure and power. And the electron temperature decreases with pressure. The methods and conclusions can be used to provide some reference for the configurations of the chamber and the coil of the ICP equipment design and improvement and process parameters selection.
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2007 First International Conference on Integration and Commercialization of Micro and Nanosystems
January 10–13, 2007
Sanya, Hainan, China
Conference Sponsors:
- Nanotechnology Institute
ISBN:
0-7918-4265-7
PROCEEDINGS PAPER
Three-Dimensional Discharge Simulation of Inductively Coupled Plasma Etcher Available to Purchase
Guanghong Duan,
Guanghong Duan
Tsinghua University, Beijing, China
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Yangying Chen
Yangying Chen
Tsinghua University, Beijing, China
Search for other works by this author on:
Jia Cheng
Tsinghua University, Beijing, China
Yu Zhu
Tsinghua University, Beijing, China
Guanghong Duan
Tsinghua University, Beijing, China
Yangying Chen
Tsinghua University, Beijing, China
Paper No:
MNC2007-21145, pp. 795-799; 5 pages
Published Online:
June 8, 2009
Citation
Cheng, J, Zhu, Y, Duan, G, & Chen, Y. "Three-Dimensional Discharge Simulation of Inductively Coupled Plasma Etcher." Proceedings of the 2007 First International Conference on Integration and Commercialization of Micro and Nanosystems. First International Conference on Integration and Commercialization of Micro and Nanosystems, Parts A and B. Sanya, Hainan, China. January 10–13, 2007. pp. 795-799. ASME. https://doi.org/10.1115/MNC2007-21145
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