The influences of different applied voltages on spinnerets and distance between spinnerets are investigated when the spinnerets are arrayed in matrix shape in electrospinning. The models of one, two, three and nine spinnerets were set up and the electric field intensity was simulated and analyzed. By experiments, the voltage thresholds of ejection at different distance, the nanofibers electrospun by different distances between the spinnerets and different voltages were explored. The experiment results show that, in some extent of distance, the electric field intensity will decrease gradually with the distance between spinnerets rising. If the tips of multi-spinneret array are in the same distance to the collector, the voltage threshold of the center spinneret is extremely high and the solution is difficult to be ejected. If the same voltage is applied on multi-spinneret array, the quality of spinning becomes worse with the applied voltage increasing, that is, the nanofibers become more chaos and their diameters increase.
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2007 First International Conference on Integration and Commercialization of Micro and Nanosystems
January 10–13, 2007
Sanya, Hainan, China
Conference Sponsors:
- Nanotechnology Institute
ISBN:
0-7918-4265-7
PROCEEDINGS PAPER
Investigation of Electrospinning With Multi-Spinneret Array
Yongyang Zhu,
Yongyang Zhu
Xiamen University, Xiamen, China
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Xuexian Wang,
Xuexian Wang
Xiamen University, Xiamen, China
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Daoheng Sun
Daoheng Sun
Xiamen University, Xiamen, China
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Yongyang Zhu
Xiamen University, Xiamen, China
Xuexian Wang
Xiamen University, Xiamen, China
Dezhi Wu
Xiamen University, Xiamen, China
Daoheng Sun
Xiamen University, Xiamen, China
Paper No:
MNC2007-21494, pp. 1513-1517; 5 pages
Published Online:
June 8, 2009
Citation
Zhu, Y, Wang, X, Wu, D, & Sun, D. "Investigation of Electrospinning With Multi-Spinneret Array." Proceedings of the 2007 First International Conference on Integration and Commercialization of Micro and Nanosystems. First International Conference on Integration and Commercialization of Micro and Nanosystems, Parts A and B. Sanya, Hainan, China. January 10–13, 2007. pp. 1513-1517. ASME. https://doi.org/10.1115/MNC2007-21494
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