Wire saw, with its ability to cut hard brittle material, such as silicon ingots, crystals and quartz, has emerged as a leading technology for production in semiconductor and photovoltaic industry. There are some defects in conventional loose abrasive wire saw such as significant industrial waste, low machining efficiency, high running costs, etc. As a countermeasure to these problems, some fixed-abrasive diamond wire saws are produced by electroplating process, bonding with resin agent or mechanical embedding of abrasive grains into piano wires. Nevertheless, there still exist disadvantages such as low efficiency of bonding process and high manufacture cost. For this reason, in the research, an idea of making fixed-abrasive diamond wire saw bonded with ultraviolet-curing resin is proposed. In manufacture process, generally, the preparation of materials, improvement of adhesion, and the art of ultraviolet curing determine what technologies is most effective. Therefore, to attain a specific set of properties in the cured wire saw and to achieve an efficient ultraviolet-curing process, the factors that influence the photopolymerization should be well understood. In this paper, the manufacturing process of an ultraviolet-curing resin wire saw is illustrated. Moreover, slicing experiments are deduced to evaluate the results of the study.
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2007 First International Conference on Integration and Commercialization of Micro and Nanosystems
January 10–13, 2007
Sanya, Hainan, China
Conference Sponsors:
- Nanotechnology Institute
ISBN:
0-7918-4265-7
PROCEEDINGS PAPER
Key Factors in Ultraviolet-Curing Wire Saw
Fuqing Liu,
Fuqing Liu
Zhejiang University of Technology, Hangzhou, China
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Chunyan Yao,
Chunyan Yao
Zhejiang University of Technology, Hangzhou, China
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Wei Peng
Wei Peng
Zhejiang University of Technology, Hangzhou, China
Search for other works by this author on:
Fuqing Liu
Zhejiang University of Technology, Hangzhou, China
Chunyan Yao
Zhejiang University of Technology, Hangzhou, China
Wei Peng
Zhejiang University of Technology, Hangzhou, China
Paper No:
MNC2007-21170, pp. 1283-1287; 5 pages
Published Online:
June 8, 2009
Citation
Liu, F, Yao, C, & Peng, W. "Key Factors in Ultraviolet-Curing Wire Saw." Proceedings of the 2007 First International Conference on Integration and Commercialization of Micro and Nanosystems. First International Conference on Integration and Commercialization of Micro and Nanosystems, Parts A and B. Sanya, Hainan, China. January 10–13, 2007. pp. 1283-1287. ASME. https://doi.org/10.1115/MNC2007-21170
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