In the present study, the meniscus profiles of water bridges formed at different relative humidity are determined using the geometric relationships including the Kelvin equation and the force equilibrium formula established for the meniscus. The pull-off forces predicted by the present model show good agreement with the experimental results reported in the literatures. When the contact angles at two solid bodies are equal, the pull-off force is slightly elevated by an increase of the relative humidity of air, and is significantly elevated by an increase of the asperity radius. Furthermore, two hydrophobic surfaces with equally large contact angles lower the pull-off force. If a difference exists between the contact angles of two solid surfaces, the asperity with a hydrophilic surface incorporating with a smooth flat plate with a hydrophobic surface reduces the pull-off force.
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2008 Second International Conference on Integration and Commercialization of Micro and Nanosystems
June 3–5, 2008
Clear Water Bay, Kowloon, Hong Kong
Conference Sponsors:
- Nanotechnology Institute
ISBN:
0-7918-4294-0
PROCEEDINGS PAPER
The Capillary Force Between an AFM Tip and a Surface at Different Humidity
Sheng Chau Chen,
Sheng Chau Chen
National Cheng Kung University, Tainan, Taiwan
Search for other works by this author on:
Jen Fin Lin
Jen Fin Lin
National Cheng Kung University, Tainan, Taiwan
Search for other works by this author on:
Sheng Chau Chen
National Cheng Kung University, Tainan, Taiwan
Jen Fin Lin
National Cheng Kung University, Tainan, Taiwan
Paper No:
MicroNano2008-70204, pp. 341-344; 4 pages
Published Online:
June 12, 2009
Citation
Chen, SC, & Lin, JF. "The Capillary Force Between an AFM Tip and a Surface at Different Humidity." Proceedings of the 2008 Second International Conference on Integration and Commercialization of Micro and Nanosystems. 2008 Second International Conference on Integration and Commercialization of Micro and Nanosystems. Clear Water Bay, Kowloon, Hong Kong. June 3–5, 2008. pp. 341-344. ASME. https://doi.org/10.1115/MicroNano2008-70204
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