In the fields of gear meshing research, biomedical and physical rehabilitation, the point-meshing force between single-point meshing objects needs to be recognized or understood to obtain some important and crucial information such as force’s changing course and transient friction force at some time. In fact, the measuring space was so very narrow that the single-point meshing force couldn’t be measured out expediently. Aim at solving this problem, a flexibly single-point force sensor was brought forward and devised. This sensor was fabricated out by silk-screen printing technologies. At the same time, the performance indexes of this sensor were measured and calculated, too. Testing parameters were minutely discussed and analyzed. Results showed that the performance indexes of the flexibly single-point force sensor could satisfy the actual measuring requirement of single-point touching objects.
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2008 Second International Conference on Integration and Commercialization of Micro and Nanosystems
June 3–5, 2008
Clear Water Bay, Kowloon, Hong Kong
Conference Sponsors:
- Nanotechnology Institute
ISBN:
0-7918-4294-0
PROCEEDINGS PAPER
A Flexibly Single-Point Force Sensor
Gaofeng Zhou,
Gaofeng Zhou
Xi’an Jiaotong University, Xi’an, China
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Yulong Zhao,
Yulong Zhao
Xi’an Jiaotong University, Xi’an, China
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Zhuangde Jiang
Zhuangde Jiang
Xi’an Jiaotong University, Xi’an, China
Search for other works by this author on:
Gaofeng Zhou
Xi’an Jiaotong University, Xi’an, China
Yulong Zhao
Xi’an Jiaotong University, Xi’an, China
Zhuangde Jiang
Xi’an Jiaotong University, Xi’an, China
Paper No:
MicroNano2008-70238, pp. 191-195; 5 pages
Published Online:
June 12, 2009
Citation
Zhou, G, Zhao, Y, & Jiang, Z. "A Flexibly Single-Point Force Sensor." Proceedings of the 2008 Second International Conference on Integration and Commercialization of Micro and Nanosystems. 2008 Second International Conference on Integration and Commercialization of Micro and Nanosystems. Clear Water Bay, Kowloon, Hong Kong. June 3–5, 2008. pp. 191-195. ASME. https://doi.org/10.1115/MicroNano2008-70238
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