Tin oxide was the first transparent conductor to have achieved significant commercialization. SnO2 is an n-type semiconductor with an optical band gap of about 3.6 eV in poly crystalline form. One of the main reasons for the wide use is its rather desirable characteristic of having both, high optical transmittance and high electrical conductivity. Under optimum deposition conditions, tin oxide crystallizes in the tetragonal (rutile) structure. In this study, nano crystalline thin oxide conductive thin films has been manufactured by thermal evaporation techniques onto steel substrates using metallic tin targets and oxidation kinetics have been studied after D.C. plasma oxidation by using XRD (X-Ray Diffraction). The activation energy of SnO and SnO2 from Sn phase transformations has also been studied.
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ASME 2008 2nd Multifunctional Nanocomposites and Nanomaterials International Conference
January 11–13, 2008
Sharm El Sheikh, Egypt
Conference Sponsors:
- Nanotechnology Institute
ISBN:
0-7918-4291-6
PROCEEDINGS PAPER
Oxidation Kinetics of Nano Crystalline Tin Oxide Conductive Thin Films
Mehmet Oguz Guler,
Mehmet Oguz Guler
Sakarya University, Sakarya, Turkey
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Mirac Alaf,
Mirac Alaf
Sakarya University, Sakarya, Turkey
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Deniz Gultekin,
Deniz Gultekin
Sakarya University, Sakarya, Turkey
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Hatem Akbulut,
Hatem Akbulut
Sakarya University, Sakarya, Turkey
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Ahmet Alp
Ahmet Alp
Sakarya University, Sakarya, Turkey
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Mehmet Oguz Guler
Sakarya University, Sakarya, Turkey
Mirac Alaf
Sakarya University, Sakarya, Turkey
Deniz Gultekin
Sakarya University, Sakarya, Turkey
Hatem Akbulut
Sakarya University, Sakarya, Turkey
Ahmet Alp
Sakarya University, Sakarya, Turkey
Paper No:
MN2008-47072, pp. 153-156; 4 pages
Published Online:
June 5, 2009
Citation
Guler, MO, Alaf, M, Gultekin, D, Akbulut, H, & Alp, A. "Oxidation Kinetics of Nano Crystalline Tin Oxide Conductive Thin Films." Proceedings of the ASME 2008 2nd Multifunctional Nanocomposites and Nanomaterials International Conference. ASME 2008 2nd Multifunctional Nanocomposites and Nanomaterials. Sharm El Sheikh, Egypt. January 11–13, 2008. pp. 153-156. ASME. https://doi.org/10.1115/MN2008-47072
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