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Keywords: thermal characterization
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Proceedings Papers
Proc. ASME. InterPACK2009, ASME 2009 InterPACK Conference, Volume 2, 615-618, July 19–23, 2009
Publisher: American Society of Mechanical Engineers
Paper No: InterPACK2009-89398
... influencing factors, such as pressure load and TIM staging time, on the test results are also discussed. Thermal Characterization Thermal Interface Materials Thermal Management Collaborative Research Material Properties Testing Thermal Test Vehicle 1Proceedings of IPACK2009 InterPACK'09 July 19...
Proceedings Papers
Proc. ASME. InterPACK2003, 2003 International Electronic Packaging Technical Conference and Exhibition, Volume 1, 521-527, July 6–11, 2003
Publisher: American Society of Mechanical Engineers
Paper No: IPACK2003-35297
... data center multi-scale thermal characterization Data center facilities, which house thousands of servers, storage devices and computing hardware, arranged in 2 meter high racks are providing many thermal challenges. Each rack can dissipate 10–15 kW, and with facilities as large as tens...
Proceedings Papers
Proc. ASME. InterPACK2003, 2003 International Electronic Packaging Technical Conference and Exhibition, Volume 2, 687-694, July 6–11, 2003
Publisher: American Society of Mechanical Engineers
Paper No: IPACK2003-35324
... of TIMs and interface/contact resistances in the industry. TIM thermal characterization BLT bulk thermal conductivity contact resistance Proceedings of IPACK03 International Electronic Packaging Technical Conference and Exhibitionresistance, the interface contact resistances are, and, hence...
Proceedings Papers
Proc. ASME. InterPACK2003, 2003 International Electronic Packaging Technical Conference and Exhibition, Volume 2, 323-330, July 6–11, 2003
Publisher: American Society of Mechanical Engineers
Paper No: IPACK2003-35142
... This paper reviews the design of a flip chip thermal test vehicle. Design requirements for different applications such as thermal characterization, assembly process optimization, and product burn-in simulation are outlined. The design processes of different thermal test chip structures including...