Interpreting sensor data requires knowledge of sensor placement and the contextual environment surrounding the sensor. For a single sensor measurement, it is easy to document the context usually by visual observation. However, for millions of sensors reporting data back to a server, the contextual information needs to be automatically extracted from either data analysis or leveraging complimentary data sources. Data layers that overlap spatially or temporally with sensor locations, can be used to extract the context and validate the measurement. The second challenge is to minimize the amount of sensor data transmitted through the internet while preserving signal information content. Here we demonstrate two methods for communication bandwidth reduction: computation at the edge and compressed sensing. We validate the above methods on wind and chemical sensor data to: (1) eliminate redundant measurement from wind sensors and (2) extract peak value of a chemical sensor measuring a methane plume. We present a general cloud based framework to validate sensor data based on statistical and physical modeling and contextual data extracted from geospatial data.
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ASME 2017 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems collocated with the ASME 2017 Conference on Information Storage and Processing Systems
August 29–September 1, 2017
San Francisco, California, USA
Conference Sponsors:
- Electronic and Photonic Packaging Division
ISBN:
978-0-7918-5809-7
PROCEEDINGS PAPER
Edge Computing and Contextual Information for the Internet of Things Sensors
Lavanya Turlapati,
Lavanya Turlapati
IBM TJ Watson Research Center, Yorktown Heights, NY
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Nigel Hinds,
Nigel Hinds
IBM TJ Watson Research Center, Yorktown Heights, NY
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Dhruv Nair,
Dhruv Nair
IBM TJ Watson Research Center, Yorktown Heights, NY
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Levente J. Klein
Levente J. Klein
IBM TJ Watson Research Center, Yorktown Heights, NY
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Lavanya Turlapati
IBM TJ Watson Research Center, Yorktown Heights, NY
Nigel Hinds
IBM TJ Watson Research Center, Yorktown Heights, NY
Dhruv Nair
IBM TJ Watson Research Center, Yorktown Heights, NY
Levente J. Klein
IBM TJ Watson Research Center, Yorktown Heights, NY
Paper No:
IPACK2017-74304, V001T03A009; 6 pages
Published Online:
October 27, 2017
Citation
Turlapati, L, Hinds, N, Nair, D, & Klein, LJ. "Edge Computing and Contextual Information for the Internet of Things Sensors." Proceedings of the ASME 2017 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems collocated with the ASME 2017 Conference on Information Storage and Processing Systems. ASME 2017 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems. San Francisco, California, USA. August 29–September 1, 2017. V001T03A009. ASME. https://doi.org/10.1115/IPACK2017-74304
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