Thinner printed wiring assemblies (PWA) and smaller clearances are driven by the continuing increase of functionality and miniaturization in portable electronic devices. The probability of secondary impact during accidental drop and impact between a circuit card and adjacent components increases with the decrease in the size and weight of the product. In particular, compared to the initial impact, impulses caused by contact during secondary impacts are typically characterized by significant increase of amplitudes and extremely short pulse widths. As a result, stress wave transmission and reflection in printed wiring boards (PWBs) can be at a frequency range close to the resonant frequencies of PWA components with miniature internal structures, such as MEMS. This study focuses on analyzing the high frequency content of the accelerations due to stress wave propagation, reflections and dispersions in the thickness direction of multilayered PWBs, caused by secondary impact, and on the consequential effects on typical failure modes with high resonant frequencies.
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ASME 2015 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems collocated with the ASME 2015 13th International Conference on Nanochannels, Microchannels, and Minichannels
July 6–9, 2015
San Francisco, California, USA
Conference Sponsors:
- Electronic and Photonic Packaging Division
ISBN:
978-0-7918-5689-5
PROCEEDINGS PAPER
Influence of Secondary Impact on Failure Modes in PWAs With High Resonant Frequency
Jingshi Meng,
Jingshi Meng
University of Maryland, College Park, MD
Search for other works by this author on:
Abhijit Dasgupta
Abhijit Dasgupta
University of Maryland, College Park, MD
Search for other works by this author on:
Jingshi Meng
University of Maryland, College Park, MD
Abhijit Dasgupta
University of Maryland, College Park, MD
Paper No:
IPACK2015-48669, V002T02A042; 6 pages
Published Online:
November 19, 2015
Citation
Meng, J, & Dasgupta, A. "Influence of Secondary Impact on Failure Modes in PWAs With High Resonant Frequency." Proceedings of the ASME 2015 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems collocated with the ASME 2015 13th International Conference on Nanochannels, Microchannels, and Minichannels. Volume 2: Advanced Electronics and Photonics, Packaging Materials and Processing; Advanced Electronics and Photonics: Packaging, Interconnect and Reliability; Fundamentals of Thermal and Fluid Transport in Nano, Micro, and Mini Scales. San Francisco, California, USA. July 6–9, 2015. V002T02A042. ASME. https://doi.org/10.1115/IPACK2015-48669
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