The aim of this study is to investigate the joint properties of Sn-58mass%Bi and Sn-57mass%Bi-0.5mass%Sb low-melting lead-free solder balls on the electroless Ni/Au and Ni/Pd/Au plated Cu electrodes fabricated with a lead-free plating solution. Compared with the conventional Ni plating solution containing lead, the soldered joints with Ni/Au and Ni/Pd/Au electrodes fabricated with the lead-free plating solution showed comparable joint properties. In the joints with Ni/Pd/Au electrodes, ball shear force increased when the Pd layer is dissolved into solder by multi reflows. In both joints with Ni/Au and Ni/Pd/Au electrodes, a part of the Ni layer was dissolved into solder and thus the (Ni,Cu)3Sn4 intermetallic compound layer formed at the joint interface. Ball shear force decreased upon aging due to the growth of the (Ni,Cu)3Sn4 layer at the joint interface.
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ASME 2013 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems
July 16–18, 2013
Burlingame, California, USA
Conference Sponsors:
- Electronic and Photonic Packaging Division
ISBN:
978-0-7918-5575-1
PROCEEDINGS PAPER
Effect of Electrode Material on Joint Strength of Soldered Joints With Sn-Bi and Sn-Bi-Sb Lead-Free Solder Balls
Akihiro Hirata,
Akihiro Hirata
Gunma University, Kiryu, Gunma, Japan
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Ikuo Shohji,
Ikuo Shohji
Gunma University, Kiryu, Gunma, Japan
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Tetsuyuki Tsuchida,
Tetsuyuki Tsuchida
Toppan Printing Co., Ltd., Sugito, Saitama, Japan
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Toshikazu Ookubo
Toshikazu Ookubo
Toppan Printing Co., Ltd., Sugito, Saitama, Japan
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Akihiro Hirata
Gunma University, Kiryu, Gunma, Japan
Ikuo Shohji
Gunma University, Kiryu, Gunma, Japan
Tetsuyuki Tsuchida
Toppan Printing Co., Ltd., Sugito, Saitama, Japan
Toshikazu Ookubo
Toppan Printing Co., Ltd., Sugito, Saitama, Japan
Paper No:
IPACK2013-73171, V001T07A011; 6 pages
Published Online:
January 20, 2014
Citation
Hirata, A, Shohji, I, Tsuchida, T, & Ookubo, T. "Effect of Electrode Material on Joint Strength of Soldered Joints With Sn-Bi and Sn-Bi-Sb Lead-Free Solder Balls." Proceedings of the ASME 2013 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems. Volume 1: Advanced Packaging; Emerging Technologies; Modeling and Simulation; Multi-Physics Based Reliability; MEMS and NEMS; Materials and Processes. Burlingame, California, USA. July 16–18, 2013. V001T07A011. ASME. https://doi.org/10.1115/IPACK2013-73171
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